Florian Hue

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Paris, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method, device and system for measuring nanoscale deformations
- Patent number 8,502,143
- Issue date Aug 6, 2013
- Centre National de la Recherche Scientifique
- Martin Hytch
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method, Device and System for Measuring Nanoscale Deformations
- Publication number 20100252735
- Publication date Oct 7, 2010
- Martin Hytch
- H01 - BASIC ELECTRIC ELEMENTS