FLORIN MUNTEANU

Person

LIVERMORE, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical measurement of lead angle of groove in manufactured part
- Patent number 9,752,868
- Issue date Sep 5, 2017
- Bruker Nano Inc.
- Erik Novak
- G05 - CONTROLLING REGULATING
Information Patent Grant
Full-color images produced by white-light interferometry
- Patent number 9,282,304
- Issue date Mar 8, 2016
- Bruker Nano Inc.
- Joanna Schmit
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Interferometric measurement of non-homogeneous multi-material surfaces
- Patent number 8,482,741
- Issue date Jul 9, 2013
- Bruker Nano Inc.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement of non-homogeneous multi-material surfaces
- Patent number 8,416,425
- Issue date Apr 9, 2013
- Bruker Nano Inc.
- Florin Munteanu
- G01 - MEASURING TESTING
Information Patent Grant
Large-surface defect detection by single-frame spatial-carrier inte...
- Patent number 8,275,573
- Issue date Sep 25, 2012
- Bruker Nano, Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement of non-homogeneous multi-material surfaces
- Patent number 8,213,021
- Issue date Jul 3, 2012
- Veeco Metrology, Inc.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement of DLC layer on magnetic head
- Patent number 7,808,652
- Issue date Oct 5, 2010
- Veeco Instruments, Inc.
- Florin Munteanu
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric iterative technique with bandwidth and numerical-ap...
- Patent number 7,505,863
- Issue date Mar 17, 2009
- Veeco Instruments, Inc.
- Florin Munteanu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MEASUREMENT OF LEAD ANGLE OF GROOVE IN MANUFACTURED PART
- Publication number 20170023356
- Publication date Jan 26, 2017
- ERIK NOVAK
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC MEASUREMENT OF NON-HOMOGENEOUS MULTI-MATERIAL SURFACES
- Publication number 20120257216
- Publication date Oct 11, 2012
- BRUKER NANO INC
- DONG CHEN
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC MEASUREMENT OF NON-HOMOGENEOUS MULTI-MATERIAL SURFACES
- Publication number 20120257215
- Publication date Oct 11, 2012
- BRUKER NANO INC
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT OF LEAD ANGLE OF GROOVE IN MANUFACTURED PART
- Publication number 20120105864
- Publication date May 3, 2012
- BRUKER NANO INC
- ERIK NOVAK
- G01 - MEASURING TESTING
Information Patent Application
Interferometric measurement of DLC layer on magnetic head
- Publication number 20090185193
- Publication date Jul 23, 2009
- VEECO INSTRUMENTS, INC.
- Florin Munteanu
- G01 - MEASURING TESTING
Information Patent Application
Interferometric iterative technique with bandwidth and numerical-ap...
- Publication number 20090018786
- Publication date Jan 15, 2009
- VEECO INSTRUMENTS, INC.
- Florin Munteanu
- G01 - MEASURING TESTING
Information Patent Application
Interferometric measurement of non-homogeneous multi-material surfaces
- Publication number 20090002775
- Publication date Jan 1, 2009
- VEECO INSTRUMENTS, INC.
- Dong Chen
- G01 - MEASURING TESTING

FLORIN MUNTEANU

Person

Patents Grantslast 30 patents

Optical measurement of lead angle of groove in manufactured part

Full-color images produced by white-light interferometry

Interferometric measurement of non-homogeneous multi-material surfaces

Interferometric measurement of non-homogeneous multi-material surfaces

Large-surface defect detection by single-frame spatial-carrier inte...

Interferometric measurement of non-homogeneous multi-material surfaces

Interferometric measurement of DLC layer on magnetic head

Interferometric iterative technique with bandwidth and numerical-ap...

Patents Applicationslast 30 patents

OPTICAL MEASUREMENT OF LEAD ANGLE OF GROOVE IN MANUFACTURED PART

INTERFEROMETRIC MEASUREMENT OF NON-HOMOGENEOUS MULTI-MATERIAL SURFACES

INTERFEROMETRIC MEASUREMENT OF NON-HOMOGENEOUS MULTI-MATERIAL SURFACES

OPTICAL MEASUREMENT OF LEAD ANGLE OF GROOVE IN MANUFACTURED PART

Interferometric measurement of DLC layer on magnetic head

Interferometric iterative technique with bandwidth and numerical-ap...

Interferometric measurement of non-homogeneous multi-material surfaces