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Floris Broekema
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Enschede, NL
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last 30 patents
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Patent Grant
Method and apparatus for classifying a signal waveform under test
Patent number
10,379,141
Issue date
Aug 13, 2019
Fluke Precision Measurement Limited
Peter Deverson
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
METHOD AND APPARATUS FOR CLASSIFYING A SIGNAL WAVEFORM UNDER TEST
Publication number
20160341766
Publication date
Nov 24, 2016
Fluke Precision Measurement Limited
Peter Deverson
G01 - MEASURING TESTING