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Floyd Schemmel
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Sherman, TX, US
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last 30 patents
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Patent Grant
Apparatus and method for automatically detecting defects on silicon...
Patent number
6,895,109
Issue date
May 17, 2005
Texas Instruments Incorporated
Floyd Schemmel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for determining a position error in a wafer handl...
Patent number
6,718,227
Issue date
Apr 6, 2004
Texas Instruments Incorporated
Floyd F. Schemmel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for automatically detecting defects on silicon...
Patent number
6,504,948
Issue date
Jan 7, 2003
Texas Instruments Incorporated
Floyd Schemmel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for detecting defective integrated circuit dies in wafer...
Patent number
6,175,646
Issue date
Jan 16, 2001
Texas Instruments Incorporated
Floyd Schemmel
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for detecting defects on silicon dies on a sil...
Patent number
5,943,551
Issue date
Aug 24, 1999
Texas Instruments Incorporated
Floyd Schemmel
G01 - MEASURING TESTING
Information
Patent Grant
Adjustable probe for probe assembly
Patent number
4,973,903
Issue date
Nov 27, 1990
Texas Instruments Incorporated
Floyd F. Schemmel
G01 - MEASURING TESTING