Fong-Zhi CHEN

Person

Taipei, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Piezoelectric vacuum gauge and measuring method thereof
- Patent number 9,140,619
- Issue date Sep 22, 2015
- National Applied Research Laboratories
- Chia-Che Wu
- G01 - MEASURING TESTING
Information Patent Grant
Near-field scanning optical microscope
- Patent number 8,393,010
- Issue date Mar 5, 2013
- National Applied Research Laboratories
- Chih-Wen Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Close-up photograph device
- Patent number 8,139,934
- Issue date Mar 20, 2012
- Instrument Technology Research Center
- Kuo-Cheng Huang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor test equipment with concentric pogo towers
- Patent number 7,973,548
- Issue date Jul 5, 2011
- King Yuan Electronics Co., Ltd.
- Fong Jay Chen
- G01 - MEASURING TESTING
Information Patent Grant
Microscope automatic focusing device and method thereof
- Patent number 7,851,735
- Issue date Dec 14, 2010
- Technology Research Center National Applied Research Laboratories
- Wei-Yao Hsu
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURE OF ULTRAVIOLET LIGHT POLARIZATION COMPONENT AND MANUFACTU...
- Publication number 20160195656
- Publication date Jul 7, 2016
- NATIONAL APPLIED RESEARCH LABORATORIES
- Po-Kai CHIU
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PIEZOELECTRIC VACUUM GAUGE AND MEASURING METHOD THEREOF
- Publication number 20130291644
- Publication date Nov 7, 2013
- NATIONAL APPLIED RESEARCH LABORATORIES
- Chia-Che Wu
- G01 - MEASURING TESTING
Information Patent Application
In Situ Manufacturing Process Monitoring System of Extreme Smooth T...
- Publication number 20130256262
- Publication date Oct 3, 2013
- NATIONAL APPLIED RESEARCH LABORATORIES
- Chien-Nan Hsiao
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
HARD AND WEAR-RESISTING PROBE AND MANUFACTURING METHOD THEREOF
- Publication number 20120212249
- Publication date Aug 23, 2012
- KING YUAN ELECTRONICS CO., LTD.
- FONG JAY CHEN
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
NEAR-FIELD SCANNING OPTICAL MICROSCOPE
- Publication number 20120159677
- Publication date Jun 21, 2012
- NATIONAL APPLIED RESEARCH LABORATORIES
- Chih-Wen CHEN
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test equipment with concentric pogo towers
- Publication number 20110018568
- Publication date Jan 27, 2011
- King Yuan Electronics Co., Ltd.
- Fong Jay Chen
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC FOCUS DEVICE AND METHOD THEREOF
- Publication number 20080135724
- Publication date Jun 12, 2008
- TECHNOLOGY RESEARCH CENTER NATIONAL APPLIED RESEARCH LABORATORIES
- Wei-Yao Hsu
- G02 - OPTICS
Information Patent Application
Polishing Device And Method With Multi Composite
- Publication number 20070099547
- Publication date May 3, 2007
- Instrument Technology Research Center, National Applied Research Laboratories
- Kuo-Cheng Huang
- B24 - GRINDING POLISHING
Information Patent Application
Close-up photograph device
- Publication number 20070047947
- Publication date Mar 1, 2007
- Instrument Technology Research Center
- Kuo-Cheng Huang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Fong-Zhi CHEN

Person

Patents Grantslast 30 patents

Piezoelectric vacuum gauge and measuring method thereof

Near-field scanning optical microscope

Close-up photograph device

Semiconductor test equipment with concentric pogo towers

Microscope automatic focusing device and method thereof

Patents Applicationslast 30 patents

STRUCTURE OF ULTRAVIOLET LIGHT POLARIZATION COMPONENT AND MANUFACTU...

PIEZOELECTRIC VACUUM GAUGE AND MEASURING METHOD THEREOF

In Situ Manufacturing Process Monitoring System of Extreme Smooth T...

HARD AND WEAR-RESISTING PROBE AND MANUFACTURING METHOD THEREOF

NEAR-FIELD SCANNING OPTICAL MICROSCOPE

Semiconductor test equipment with concentric pogo towers

AUTOMATIC FOCUS DEVICE AND METHOD THEREOF

Polishing Device And Method With Multi Composite

Close-up photograph device