Fook-Luen Heng

Person

Yorktown Heighte, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Network management using hierarchical and multi-scenario graphs
- Patent number 11,888,698
- Issue date Jan 30, 2024
- Utopous Insights, Inc.
- Ulrich A. Finkler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for forecasting leaks in a fluid-delivery pipelin...
- Patent number 11,620,553
- Issue date Apr 4, 2023
- Utopus Insights, Inc.
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Weather-driven multi-category infrastructure impact forecasting
- Patent number 11,598,900
- Issue date Mar 7, 2023
- Utopus Insights, Inc.
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Network management using hierarchical and multi-scenario graphs
- Patent number 11,349,720
- Issue date May 31, 2022
- Utopus Insights, Inc.
- Ulrich A. Finkler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Weather-driven multi-category infrastructure impact forecasting
- Patent number 11,048,021
- Issue date Jun 29, 2021
- Utopus Insights, Inc.
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Weather-driven multi-category infrastructure impact forecasting
- Patent number 10,989,838
- Issue date Apr 27, 2021
- Utopus Insights, Inc.
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Network management using hierarchical and multi-scenario graphs
- Patent number 10,574,533
- Issue date Feb 25, 2020
- Utopus Insights, Inc.
- Ulrich A. Finkler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Quantifying a combined effect of interdependent uncertain resources...
- Patent number 10,521,525
- Issue date Dec 31, 2019
- International Business Machines Corporation
- Aanchal Goyal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Weather-driven multi-category infrastructure impact forecasting
- Patent number 10,387,802
- Issue date Aug 20, 2019
- Utopus Insights, Inc.
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Network management using hierarchical and multi-scenario graphs
- Patent number 9,893,948
- Issue date Feb 13, 2018
- Utopus Insights, Inc.
- Ulrich A. Finkler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Network management using hierarchical and multi-scenario graphs
- Patent number 9,882,782
- Issue date Jan 30, 2018
- Utopus Insights, Inc.
- Ulrich A. Finkler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Weather-driven multi-category infrastructure impact forecasting
- Patent number 9,536,214
- Issue date Jan 3, 2017
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analyzing a patterning process using a model of yield
- Patent number 8,880,382
- Issue date Nov 4, 2014
- International Business Machines Corporation
- Saeed Bagheri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analyzing a patterning process using a model of yield
- Patent number 8,682,634
- Issue date Mar 25, 2014
- International Business Machines Corporation
- Saeed Bagheri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spatial correlation-based estimation of yield of integrated circuits
- Patent number 8,522,173
- Issue date Aug 27, 2013
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical design system and method
- Patent number 8,473,885
- Issue date Jun 25, 2013
- International Business Machines Corporation
- John M. Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technology migration for integrated circuits with radical design re...
- Patent number 8,464,189
- Issue date Jun 11, 2013
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structural migration of integrated circuit layout
- Patent number 8,423,941
- Issue date Apr 16, 2013
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of distributing a random variable using statistically correc...
- Patent number 8,423,328
- Issue date Apr 16, 2013
- International Business Machines Corporation
- John M. Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spatial correlation-based estimation of yield of integrated circuits
- Patent number 8,276,102
- Issue date Sep 25, 2012
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical design system and method
- Patent number 8,219,943
- Issue date Jul 10, 2012
- International Business Machines Corporation
- John M Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing integrated circuit chip designs for optical proximity co...
- Patent number 8,122,387
- Issue date Feb 21, 2012
- International Business Macines Corporation
- Geng Han
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Geometry based electrical hotspot detection in integrated circuit l...
- Patent number 8,108,803
- Issue date Jan 31, 2012
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Layout quality gauge for integrated circuit design
- Patent number 8,020,120
- Issue date Sep 13, 2011
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for employing patterning process statistics for g...
- Patent number 7,962,865
- Issue date Jun 14, 2011
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit selective scaling
- Patent number 7,882,463
- Issue date Feb 1, 2011
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
CA resistance variability prediction methodology
- Patent number 7,831,941
- Issue date Nov 9, 2010
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technology migration for integrated circuits with radical design re...
- Patent number 7,761,821
- Issue date Jul 20, 2010
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to determine the root causes of failure patterns by using sp...
- Patent number 7,676,775
- Issue date Mar 9, 2010
- International Business Machines Corporation
- Howard Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Technology migration for integrated circuits with radical design re...
- Patent number 7,610,565
- Issue date Oct 27, 2009
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
NETWORK MANAGEMENT USING HIERARCHICAL AND MULTI-SCENARIO GRAPHS
- Publication number 20240267297
- Publication date Aug 8, 2024
- Utopus Insights, Inc.
- Ulrich A. Finkler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WEATHER-DRIVEN MULTI-CATEGORY INFRASTRUCTURE IMPACT FORECASTING
- Publication number 20230194756
- Publication date Jun 22, 2023
- Utopus Insights, Inc.
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NETWORK MANAGEMENT USING HIERARCHICAL AND MULTI-SCENARIO GRAPHS
- Publication number 20220294700
- Publication date Sep 15, 2022
- Utopus Insights, Inc.
- Ulrich A. Finkler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WEATHER-DRIVEN MULTI-CATEGORY INFRASTRUCTURE IMPACT FORECASTING
- Publication number 20210223434
- Publication date Jul 22, 2021
- Utopus Insights, Inc.
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NETWORK MANAGEMENT USING HIERARCHICAL AND MULTI-SCENARIO GRAPHS
- Publication number 20200304376
- Publication date Sep 24, 2020
- Utopus Insights, Inc.
- Ulrich A. Finkler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WEATHER-DRIVEN MULTI-CATEGORY INFRASTRUCTURE IMPACT FORECASTING
- Publication number 20200111020
- Publication date Apr 9, 2020
- Utopus Insights, Inc.
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NETWORK MANAGEMENT USING HIERARCHICAL AND MULTI-SCENARIO GRAPHS
- Publication number 20190036784
- Publication date Jan 31, 2019
- Utopus Insights, Inc.
- Ulrich A. Finkler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
QUANTIFYING A COMBINED EFFECT OF INTERDEPENDENT UNCERTAIN RESOURCES...
- Publication number 20180210976
- Publication date Jul 26, 2018
- International Business Machines Corporation
- Aanchal Goyal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR FORECASTING LEAKS IN A FLUID-DELIVERY PIPELIN...
- Publication number 20170308796
- Publication date Oct 26, 2017
- Utopus Insights, Inc.
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WEATHER-DRIVEN MULTI-CATEGORY INFRASTRUCTURE IMPACT FORECASTING
- Publication number 20170017904
- Publication date Jan 19, 2017
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WEATHER-DRIVEN MULTI-CATEGORY INFRASTRUCTURE IMPACT FORECASTING
- Publication number 20160306075
- Publication date Oct 20, 2016
- International Business Machines Corporation
- Fook-Luen Heng
- G01 - MEASURING TESTING
Information Patent Application
WEATHER-DRIVEN MULTI-CATEGORY INFRASTRUCTURE IMPACT FORECASTING
- Publication number 20160307138
- Publication date Oct 20, 2016
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NETWORK MANAGEMENT USING HIERARCHICAL AND MULTI-SCENARIO GRAPHS
- Publication number 20160285692
- Publication date Sep 29, 2016
- International Business Machines Corporation
- Ulrich A. Finkler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NETWORK MANAGEMENT USING HIERARCHICAL AND MULTI-SCENARIO GRAPHS
- Publication number 20160285693
- Publication date Sep 29, 2016
- International Business Machines Corporation
- Ulrich A. Finkler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Analyzing A Patterning Process Using A Model Of Yield
- Publication number 20130185046
- Publication date Jul 18, 2013
- International Business Machines Corporation
- Saeed BAGHERI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYZING A PATTERNING PROCESS USING A MODEL OF YIELD
- Publication number 20130185045
- Publication date Jul 18, 2013
- International Business Machines Corporation
- Saeed BAGHERI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRUCTURAL MIGRATION OF INTEGRATED CIRCUIT LAYOUT
- Publication number 20130042217
- Publication date Feb 14, 2013
- International Business Machines Corporation
- Fook-Luen HENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Spatial Correlation-Based Estimation of Yield of Integrated Circuits
- Publication number 20120311510
- Publication date Dec 6, 2012
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHYSICAL DESIGN SYSTEM AND METHOD
- Publication number 20120167029
- Publication date Jun 28, 2012
- International Business Machines Corporation
- John M. Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Spatial Correlation-Based Estimation of Yield of Integrated Circuits
- Publication number 20110219344
- Publication date Sep 8, 2011
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Techniques for Pattern Process Tuning and Design Optimization for M...
- Publication number 20110173577
- Publication date Jul 14, 2011
- International Business Machines Corporation
- Ching-Te K. Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GEOMETRY BASED ELECTRICAL HOTSPOT DETECTION IN INTEGRATED CIRCUIT L...
- Publication number 20110099529
- Publication date Apr 28, 2011
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Distributing a Random Variable Using Statistically Correc...
- Publication number 20110077916
- Publication date Mar 31, 2011
- International Business Machines Corporation
- John M Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INTEGRATED CIRCUIT CHIP FABRICATION AND PROGRAM PRODUCT T...
- Publication number 20100318956
- Publication date Dec 16, 2010
- International Business Machines Corporation
- Geng Han
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TECHNOLOGY MIGRATION FOR INTEGRATED CIRCUITS WITH RADICAL DESIGN RE...
- Publication number 20100185997
- Publication date Jul 22, 2010
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IPHYSICAL DESIGN SYSTEM AND METHOD
- Publication number 20090204930
- Publication date Aug 13, 2009
- International Business Machines Corporation
- John M. Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CA RESISTANCE VARIABILITY PREDICTION METHODOLOGY
- Publication number 20090171644
- Publication date Jul 2, 2009
- International Business Machines Corporation
- Dureseti Chidambarrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Layout Quality Gauge for Integrated Circuit Design
- Publication number 20090089726
- Publication date Apr 2, 2009
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method to Determine the Root Causes of Failure Patterns by Using Sp...
- Publication number 20080301597
- Publication date Dec 4, 2008
- International Business Machines Corporation
- Howard Chen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR EMPLOYING PATTERNING PROCESS STATISTICS FOR G...
- Publication number 20080301624
- Publication date Dec 4, 2008
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING

Fook-Luen Heng

Person

Patents Grantslast 30 patents

Network management using hierarchical and multi-scenario graphs

System and method for forecasting leaks in a fluid-delivery pipelin...

Weather-driven multi-category infrastructure impact forecasting

Network management using hierarchical and multi-scenario graphs

Weather-driven multi-category infrastructure impact forecasting

Weather-driven multi-category infrastructure impact forecasting

Network management using hierarchical and multi-scenario graphs

Quantifying a combined effect of interdependent uncertain resources...

Weather-driven multi-category infrastructure impact forecasting

Network management using hierarchical and multi-scenario graphs

Network management using hierarchical and multi-scenario graphs

Weather-driven multi-category infrastructure impact forecasting

Analyzing a patterning process using a model of yield

Analyzing a patterning process using a model of yield

Spatial correlation-based estimation of yield of integrated circuits

Physical design system and method

Technology migration for integrated circuits with radical design re...

Structural migration of integrated circuit layout

Method of distributing a random variable using statistically correc...

Spatial correlation-based estimation of yield of integrated circuits

Physical design system and method

Optimizing integrated circuit chip designs for optical proximity co...

Geometry based electrical hotspot detection in integrated circuit l...

Layout quality gauge for integrated circuit design

System and method for employing patterning process statistics for g...

Integrated circuit selective scaling

CA resistance variability prediction methodology

Technology migration for integrated circuits with radical design re...

Method to determine the root causes of failure patterns by using sp...

Technology migration for integrated circuits with radical design re...

Patents Applicationslast 30 patents

NETWORK MANAGEMENT USING HIERARCHICAL AND MULTI-SCENARIO GRAPHS

WEATHER-DRIVEN MULTI-CATEGORY INFRASTRUCTURE IMPACT FORECASTING

NETWORK MANAGEMENT USING HIERARCHICAL AND MULTI-SCENARIO GRAPHS

WEATHER-DRIVEN MULTI-CATEGORY INFRASTRUCTURE IMPACT FORECASTING

NETWORK MANAGEMENT USING HIERARCHICAL AND MULTI-SCENARIO GRAPHS

WEATHER-DRIVEN MULTI-CATEGORY INFRASTRUCTURE IMPACT FORECASTING

NETWORK MANAGEMENT USING HIERARCHICAL AND MULTI-SCENARIO GRAPHS

QUANTIFYING A COMBINED EFFECT OF INTERDEPENDENT UNCERTAIN RESOURCES...

SYSTEM AND METHOD FOR FORECASTING LEAKS IN A FLUID-DELIVERY PIPELIN...

WEATHER-DRIVEN MULTI-CATEGORY INFRASTRUCTURE IMPACT FORECASTING

WEATHER-DRIVEN MULTI-CATEGORY INFRASTRUCTURE IMPACT FORECASTING

WEATHER-DRIVEN MULTI-CATEGORY INFRASTRUCTURE IMPACT FORECASTING

NETWORK MANAGEMENT USING HIERARCHICAL AND MULTI-SCENARIO GRAPHS

NETWORK MANAGEMENT USING HIERARCHICAL AND MULTI-SCENARIO GRAPHS

Analyzing A Patterning Process Using A Model Of Yield

ANALYZING A PATTERNING PROCESS USING A MODEL OF YIELD

STRUCTURAL MIGRATION OF INTEGRATED CIRCUIT LAYOUT

Spatial Correlation-Based Estimation of Yield of Integrated Circuits

PHYSICAL DESIGN SYSTEM AND METHOD

Spatial Correlation-Based Estimation of Yield of Integrated Circuits

Techniques for Pattern Process Tuning and Design Optimization for M...

GEOMETRY BASED ELECTRICAL HOTSPOT DETECTION IN INTEGRATED CIRCUIT L...

Method of Distributing a Random Variable Using Statistically Correc...

METHOD OF INTEGRATED CIRCUIT CHIP FABRICATION AND PROGRAM PRODUCT T...

TECHNOLOGY MIGRATION FOR INTEGRATED CIRCUITS WITH RADICAL DESIGN RE...

IPHYSICAL DESIGN SYSTEM AND METHOD

CA RESISTANCE VARIABILITY PREDICTION METHODOLOGY

Layout Quality Gauge for Integrated Circuit Design

Method to Determine the Root Causes of Failure Patterns by Using Sp...

SYSTEM AND METHOD FOR EMPLOYING PATTERNING PROCESS STATISTICS FOR G...