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Forrest A. Edwards
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Wilsonville, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Architecture providing increased information display for long acqui...
Patent number
6,847,905
Issue date
Jan 25, 2005
Tektronix, Inc.
Eric P. Etheridge
G01 - MEASURING TESTING
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Patent Grant
Dithering apparatus to properly represent aliased signals for high...
Patent number
6,388,595
Issue date
May 14, 2002
Tektronix, Inc.
Forrest A. Edwards
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Architecture providing increased information display for long acqui...
Publication number
20040008160
Publication date
Jan 15, 2004
Eric P. Etheridge
G01 - MEASURING TESTING