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Francis Bos
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Longjumeau, FR
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last 30 patents
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Patent Grant
Achromatic spectroscopic ellipsometer with high spatial resolution
Patent number
7,184,145
Issue date
Feb 27, 2007
Horiba Jobin Yvon, Inc.
Pascal Amary
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method and device for polarimetric measurement of the mueller matri...
Publication number
20050105088
Publication date
May 19, 2005
Enrique Garcia-Caurel
G01 - MEASURING TESTING