Francis C. Tambwe

Person

Malta, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of forming alignment marks and overlay marks on integrated...
- Patent number 9,515,026
- Issue date Dec 6, 2016
- GLOBALFOUNDRIES Inc.
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming alignment marks and overlay marks on integrated...
- Patent number 9,275,890
- Issue date Mar 1, 2016
- GLOBALFOUNDRIES Inc.
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming a FinFET semiconductor device with undoped fins
- Patent number 9,105,507
- Issue date Aug 11, 2015
- GLOBALFOUNDRIES Inc.
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual work function FinFET structures and methods for fabricating th...
- Patent number 8,975,141
- Issue date Mar 10, 2015
- GLOBALFOUNDRIES, INC.
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming a finfet semiconductor device with undoped fins
- Patent number 8,969,932
- Issue date Mar 3, 2015
- GLOBALFOUNDRIES Inc.
- Andy C. Wei
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Methods for fabricating FinFET integrated circuits on bulk semicond...
- Patent number 8,603,893
- Issue date Dec 10, 2013
- GLOBALFOUNDRIES, INC.
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF FORMING ALIGNMENT MARKS AND OVERLAY MARKS ON INTEGRATED...
- Publication number 20160141252
- Publication date May 19, 2016
- GLOBALFOUNDRIES INC.
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING A FINFET SEMICONDUCTOR DEVICE WITH UNDOPED FINS
- Publication number 20150123214
- Publication date May 7, 2015
- GLOBALFOUNDRIES INC.
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING ALIGNMENT MARKS AND OVERLAY MARKS ON INTEGRATED...
- Publication number 20140264631
- Publication date Sep 18, 2014
- GLOBALFOUNDRIES INC.
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING A FINFET SEMICONDUCTOR DEVICE WITH UNDOPED FINS
- Publication number 20140159126
- Publication date Jun 12, 2014
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRUIT INCLUDING AN FIN-BASED DIODE AND METHODS OF ITS F...
- Publication number 20140131831
- Publication date May 15, 2014
- GLOBALFOUNDRIES, Inc.
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL WORK FUNCTION FINFET STRUCTURES AND METHODS FOR FABRICATING TH...
- Publication number 20140038402
- Publication date Feb 6, 2014
- GLOBALFOUNDRIES INC.
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FABRICATING FINFET INTEGRATED CIRCUITS ON BULK SEMICOND...
- Publication number 20130309838
- Publication date Nov 21, 2013
- Andy C. Wei
- H01 - BASIC ELECTRIC ELEMENTS

Francis C. Tambwe

Person

Patents Grantslast 30 patents

Methods of forming alignment marks and overlay marks on integrated...

Methods of forming alignment marks and overlay marks on integrated...

Methods of forming a FinFET semiconductor device with undoped fins

Dual work function FinFET structures and methods for fabricating th...

Methods of forming a finfet semiconductor device with undoped fins

Methods for fabricating FinFET integrated circuits on bulk semicond...

Patents Applicationslast 30 patents

METHODS OF FORMING ALIGNMENT MARKS AND OVERLAY MARKS ON INTEGRATED...

METHODS OF FORMING A FINFET SEMICONDUCTOR DEVICE WITH UNDOPED FINS

METHODS OF FORMING ALIGNMENT MARKS AND OVERLAY MARKS ON INTEGRATED...

METHODS OF FORMING A FINFET SEMICONDUCTOR DEVICE WITH UNDOPED FINS

INTEGRATED CIRUIT INCLUDING AN FIN-BASED DIODE AND METHODS OF ITS F...

DUAL WORK FUNCTION FINFET STRUCTURES AND METHODS FOR FABRICATING TH...

METHODS FOR FABRICATING FINFET INTEGRATED CIRCUITS ON BULK SEMICOND...