Francis Gravel

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Westford, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect diagnosis for semiconductor integrated circuits
- Patent number 7,089,514
- Issue date Aug 8, 2006
- International Business Machines Corporation
- James W. Adkisson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DIAGNOSIS FOR SEMICONDUCTOR INTEGRATED CIRCUITS
- Publication number 20060036975
- Publication date Feb 16, 2006
- International Business Machines Corporation
- James W. Adkisson
- G01 - MEASURING TESTING