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Francis Ho
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Stanford, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
High throughput flash memory system
Patent number
9,053,009
Issue date
Jun 9, 2015
Inphi Corporation
Francis Ho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
High throughput flash memory system
Patent number
8,316,175
Issue date
Nov 20, 2012
Inphi Corporation
Francis Ho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Photoconductive-sampling voltage measurement
Patent number
6,737,853
Issue date
May 18, 2004
NPTest, LLC
Kenneth R. Wilsher
G01 - MEASURING TESTING
Information
Patent Grant
Method of making released micromachined structures by directional e...
Patent number
6,086,774
Issue date
Jul 11, 2000
The Board of Trustees of the Stanford Leland Junior University
Francis Ho
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Electrical contact probe for sampling high frequency electrical sig...
Patent number
5,847,569
Issue date
Dec 8, 1998
The Board of Trustees of the Leland Stanford Junior University
Francis Ho
G01 - MEASURING TESTING
Information
Patent Grant
System and method for high-speed potentiometry using scanning probe...
Patent number
5,488,305
Issue date
Jan 30, 1996
The Board of Trustees of the Leland Stanford Junior University
David M. Bloom
B82 - NANO-TECHNOLOGY
Information
Patent Grant
System and method of measuring high-speed electrical waveforms usin...
Patent number
5,381,101
Issue date
Jan 10, 1995
The Board of Trustees of the Leland Stanford Junior University
David M. Bloom
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
HIGH THROUGHPUT FLASH MEMORY SYSTEM
Publication number
20130132646
Publication date
May 23, 2013
INPHI CORPORATION
Francis HO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
High Throughput Flash Memory System
Publication number
20110107013
Publication date
May 5, 2011
Francis Ho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Photoconductive-sampling voltage measurement
Publication number
20030076122
Publication date
Apr 24, 2003
Kenneth R. Wilsher
G01 - MEASURING TESTING