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Francis M. Erdmann
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Anaheim, CA, US
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last 30 patents
Information
Patent Grant
Interferometer alignment control apparatus
Patent number
5,102,214
Issue date
Apr 7, 1992
Rockwell International Corporation
Kenneth L. Steele
G01 - MEASURING TESTING
Information
Patent Grant
Process for in-situ formation of niobium-insulator-niobium Josephso...
Patent number
4,432,134
Issue date
Feb 21, 1984
Rockwell International Corporation
Addison B. Jones
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fabrication of a nonvolatile memory array device
Patent number
4,279,069
Issue date
Jul 21, 1981
Rockwell International Corporation
Moiz M. E. Beguwala
G11 - INFORMATION STORAGE
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Patent Grant
Process for direct thermal nitridation of silicon semiconductor dev...
Patent number
4,277,320
Issue date
Jul 7, 1981
Rockwell International Corporation
Moiz M. E. Beguwala
H01 - BASIC ELECTRIC ELEMENTS