Francis M. Taylor

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Xenia, OH, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for optically measuring the distance to a work...
- Patent number 4,527,893
- Issue date Jul 9, 1985
- Francis M. Taylor
- G01 - MEASURING TESTING
Information Patent Grant
Walking-gate ultrasonic flaw detector
- Patent number 4,292,848
- Issue date Oct 6, 1981
- Systems Research Laboratories, Inc.
- J. Montgomery Rainey
- G01 - MEASURING TESTING
Information Patent Grant
Electronic comparator for process control
- Patent number 4,097,849
- Issue date Jun 27, 1978
- Systems Research Laboratories, Inc.
- Francis M. Taylor
- G05 - CONTROLLING REGULATING
Information Patent Grant
Optical dimension measuring device employing an elongated focused beam
- Patent number 4,074,938
- Issue date Feb 21, 1978
- Systems Research Laboratories, Inc.
- Francis M. Taylor
- G01 - MEASURING TESTING
Information Patent Grant
Light beam shape control in optical measuring apparatus
- Patent number 4,007,992
- Issue date Feb 15, 1977
- Techmet Company
- Harry G. Petrohilos
- G01 - MEASURING TESTING