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Francis T. McQuade
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Hutto, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Probe card for testing semiconductor wafers
Patent number
10,281,491
Issue date
May 7, 2019
Translarity, Inc.
Francis T. McQuade
G01 - MEASURING TESTING
Information
Patent Grant
Probing assembly for testing integrated circuits
Patent number
8,717,056
Issue date
May 6, 2014
Francis T. McQuade
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PROBE CARD FOR TESTING SEMICONDUCTOR WAFERS
Publication number
20180149675
Publication date
May 31, 2018
BUCKLINGBEAM
FRANCIS T. MCQUADE
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD FOR TESTING SEMICONDUCTOR WAFERS
Publication number
20150369842
Publication date
Dec 24, 2015
Francis T. McQuade
G01 - MEASURING TESTING
Information
Patent Application
Probing Assembly for Testing Integrated Circuits
Publication number
20130249586
Publication date
Sep 26, 2013
Francis T. McQuade
G01 - MEASURING TESTING