Franciscus Bernardus Maria VAN BILSEN

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for measuring a property of a substrate
- Patent number 11,977,034
- Issue date May 7, 2024
- ASML Netherlands B.V.
- Wouter Lodewijk Elings
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Methods and apparatus for measuring a property of a substrate
- Patent number 10,996,176
- Issue date May 4, 2021
- ASML Netherlands B.V.
- Wouter Lodewijk Elings
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and apparatus for measuring a property of a substrate
- Patent number 10,746,668
- Issue date Aug 18, 2020
- ASML Netherlands B.V.
- Wouter Lodewijk Elings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for measuring a property of a substrate
- Patent number 10,317,191
- Issue date Jun 11, 2019
- ASML Netherlands B.V.
- Wouter Lodewijk Elings
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and apparatus for measuring a property of a substrate
- Patent number 9,594,029
- Issue date Mar 14, 2017
- ASML Netherlands B.V.
- Wouter Lodewijk Elings
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Methods and Apparatus for Measuring a Property of a Substrate
- Publication number 20210215622
- Publication date Jul 15, 2021
- ASML NETHERLANDS B.V.
- Wouter Lodewijk ELINGS
- G05 - CONTROLLING REGULATING
Information Patent Application
Methods and Apparatus for Measuring a Property of a Substrate
- Publication number 20200319118
- Publication date Oct 8, 2020
- ASML NETHERLANDS B.V.
- Wouter Lodewijk ELINGS
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Methods and Apparatus for Measuring a Property of a Substrate
- Publication number 20190301850
- Publication date Oct 3, 2019
- ASML NETHERLANDS B.V.
- Wouter Lodewijk ELINGS
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Measuring a Property of a Substrate
- Publication number 20170160073
- Publication date Jun 8, 2017
- ASML NETHERLANDS B.V.
- Wouter Lodewijk ELINGS
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Measuring A Property of a Substrate
- Publication number 20140354969
- Publication date Dec 4, 2014
- ASML NETHERLANDS B.V.
- Wouter Lodewijk Elings
- G01 - MEASURING TESTING
Information Patent Application
Alignment systems and methods for lithographic systems
- Publication number 20070176128
- Publication date Aug 2, 2007
- ASML NETHERLANDS B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ALIGNMENT STRATEGY OPTIMIZATION METHOD
- Publication number 20060103822
- Publication date May 18, 2006
- ASML NETHERLANDS B.V.
- Roy Werkman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment systems and methods for lithographic systems
- Publication number 20060091330
- Publication date May 4, 2006
- ASML NETHERLANDS B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment systems and methods for lithographic systems
- Publication number 20060081791
- Publication date Apr 20, 2006
- ASML NETHERLANDS B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment systems and methods for lithographic systems
- Publication number 20060081792
- Publication date Apr 20, 2006
- ASML NETHERLANDS B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment systems and methods for lithographic systems
- Publication number 20060081790
- Publication date Apr 20, 2006
- ASML NETHERLANDS B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment systems and methods for lithographic systems
- Publication number 20050189502
- Publication date Sep 1, 2005
- ASML NETHERLANDS B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Franciscus Bernardus Maria VAN BILSEN

Person

Patents Grantslast 30 patents

Methods and apparatus for measuring a property of a substrate

Methods and apparatus for measuring a property of a substrate

Methods and apparatus for measuring a property of a substrate

Methods and apparatus for measuring a property of a substrate

Methods and apparatus for measuring a property of a substrate

Patents Applicationslast 30 patents

Methods and Apparatus for Measuring a Property of a Substrate

Methods and Apparatus for Measuring a Property of a Substrate

Methods and Apparatus for Measuring a Property of a Substrate

Methods and Apparatus for Measuring a Property of a Substrate

Methods and Apparatus for Measuring A Property of a Substrate

Alignment systems and methods for lithographic systems

ALIGNMENT STRATEGY OPTIMIZATION METHOD

Alignment systems and methods for lithographic systems

Alignment systems and methods for lithographic systems

Alignment systems and methods for lithographic systems

Alignment systems and methods for lithographic systems

Alignment systems and methods for lithographic systems