Franciscus Martinus Henricus Maria van Laarhoven

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Waalre, NL

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle microscope with special aperture plate
- Patent number 9,934,936
- Issue date Apr 3, 2018
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE MICROSCOPE WITH SPECIAL APERTURE PLATE
- Publication number 20160111247
- Publication date Apr 21, 2016
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS