Franciscus P. M. Beenker

Follow

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method for testing an integrated circuit means having a hierarchica...
- Patent number 5,477,548
- Issue date Dec 19, 1995
- U.S. Philips Corporation
- Franciscus P. M. Beenker
- G01 - MEASURING TESTING
Information Patent Grant
Memory device containing a static ram memory that is adapted for ex...
- Patent number 5,325,367
- Issue date Jun 28, 1994
- U.S. Philips Corporation
- Robertus W. C. Dekker
- G11 - INFORMATION STORAGE
Information Patent Grant
Testable carriers for integrated circuits
- Patent number 4,879,717
- Issue date Nov 7, 1989
- U.S. Philips Corp.
- Wilhelm A. Sauerwald
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing a modified booth multiplier, modified booth multi...
- Patent number 4,866,715
- Issue date Sep 12, 1989
- U.S. Philips Corporation
- Jozef L. Van Meerbergen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuits, carriers therefor and testing apparatus and me...
- Patent number 4,791,358
- Issue date Dec 13, 1988
- U.S. Philips Corporation
- Wilhelm A. Sauerwald
- G01 - MEASURING TESTING