Franco Motika

Person

Hopewell Junction, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
User privacy for autonomous vehicles
- Patent number 12,105,834
- Issue date Oct 1, 2024
- International Business Machines Corporation
- Mary P. Kusko
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Secure credit card with near field communications
- Patent number 11,263,619
- Issue date Mar 1, 2022
- Ebay Inc.
- Edward E. Kelley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic weight selection process for logic built-in self test
- Patent number 11,112,457
- Issue date Sep 7, 2021
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Empirical LBIST latch switching and state probability determination
- Patent number 11,105,853
- Issue date Aug 31, 2021
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Grant
Logic built-in self test dynamic weight selection method
- Patent number 11,079,433
- Issue date Aug 3, 2021
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Grant
Iterative functional test exerciser reload and execution
- Patent number 10,930,364
- Issue date Feb 23, 2021
- International Business Machines Corporation
- Franco Motika
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in device testing of integrated circuits
- Patent number 10,768,230
- Issue date Sep 8, 2020
- International Business Machines Corporation
- Robert M. Casatuta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-destructive recirculation test support for integrated circuits
- Patent number 10,613,142
- Issue date Apr 7, 2020
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for performing test and calibration of integrat...
- Patent number 10,598,526
- Issue date Mar 24, 2020
- International Business Machines Corporation
- Mitesh Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Functional diagnostics based on dynamic selection of alternate cloc...
- Patent number 10,585,142
- Issue date Mar 10, 2020
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Performing system functional test on a chip having partial-good por...
- Patent number 10,571,519
- Issue date Feb 25, 2020
- International Business Machines Corporation
- Mitesh A. Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Functional diagnostics based on dynamic selection of alternate cloc...
- Patent number 10,545,188
- Issue date Jan 28, 2020
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for performing test and calibration of integrat...
- Patent number 10,365,132
- Issue date Jul 30, 2019
- International Business Machines Corporation
- Mitesh Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Iterative N-detect based logic diagnostic technique
- Patent number 10,254,336
- Issue date Apr 9, 2019
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Structurally assisted functional test and diagnostics for integrate...
- Patent number 10,247,776
- Issue date Apr 2, 2019
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating functional test patterns for man...
- Patent number 10,209,306
- Issue date Feb 19, 2019
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating functional test patterns for man...
- Patent number 10,203,371
- Issue date Feb 12, 2019
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic fault model generation for diagnostics simulation and patte...
- Patent number 10,169,510
- Issue date Jan 1, 2019
- International Business Machines Corporation
- Mary P. Kusko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Iterative N-detect based logic diagnostic technique
- Patent number 10,024,910
- Issue date Jul 17, 2018
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating functional test patterns for man...
- Patent number 9,857,422
- Issue date Jan 2, 2018
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic fault model generation for diagnostics simulation and patte...
- Patent number 9,852,245
- Issue date Dec 26, 2017
- International Business Machines Corporation
- Mary P. Kusko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing generation of test configurations for built-in self-testing
- Patent number 9,588,177
- Issue date Mar 7, 2017
- International Business Machines Corporation
- Eugene R. Atwood
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic fault model generation for diagnostics simulation and patte...
- Patent number 9,552,449
- Issue date Jan 24, 2017
- International Business Machines Corporation
- Mary P. Kusko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip authentication using scan chains
- Patent number 9,506,983
- Issue date Nov 29, 2016
- International Business Machines Corporation
- Franco Motika
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Secure credit card with near field communications
- Patent number 9,286,605
- Issue date Mar 15, 2016
- Ebay Inc.
- Edward E. Kelley
- G07 - CHECKING-DEVICES
Information Patent Grant
Rules driven multiple passwords
- Patent number 9,231,981
- Issue date Jan 5, 2016
- International Business Machines Corporation
- Wayne M. Delia
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
GUI pointer automatic position vectoring
- Patent number 9,182,881
- Issue date Nov 10, 2015
- International Business Machines Corporation
- Edward E. Kelley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip authentication using scan chains
- Patent number 9,069,989
- Issue date Jun 30, 2015
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Grant
Method and system of preserving purchased on-demand transportation...
- Patent number 8,930,278
- Issue date Jan 6, 2015
- International Business Machines Corporation
- Wayne M. Delia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for preventing password theft through unauthorize...
- Patent number 8,925,073
- Issue date Dec 30, 2014
- International Business Machines Corporation
- Wayne M. Delia
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
USER PRIVACY FOR AUTONOMOUS VEHICLES
- Publication number 20220027501
- Publication date Jan 27, 2022
- International Business Machines Corporation
- Mary P. Kusko
- B60 - VEHICLES IN GENERAL
Information Patent Application
EMPIRICAL LBIST LATCH SWITCHING AND STATE PROBABILITY DETERMINATION
- Publication number 20210270898
- Publication date Sep 2, 2021
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC WEIGHT SELECTION PROCESS FOR LOGIC BUILT-IN SELF TEST
- Publication number 20210156910
- Publication date May 27, 2021
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
LOGIC BUILT-IN SELF TEST DYNAMIC WEIGHT SELECTION METHOD
- Publication number 20210156911
- Publication date May 27, 2021
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Application
ITERATIVE FUNCTIONAL TEST EXERCISER RELOAD AND EXECUTION
- Publication number 20200160932
- Publication date May 21, 2020
- International Business Machines Corporation
- Franco Motika
- G11 - INFORMATION STORAGE
Information Patent Application
FUNCTIONAL DIAGNOSTICS BASED ON DYNAMIC SELECTION OF ALTERNATE CLOC...
- Publication number 20190094297
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL DIAGNOSTICS BASED ON DYNAMIC SELECTION OF ALTERNATE CLOC...
- Publication number 20190094298
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR PERFORMING TEST AND CALIBRATION OF INTEGRAT...
- Publication number 20180306610
- Publication date Oct 25, 2018
- International Business Machines Corporation
- Mitesh Agrawal
- G01 - MEASURING TESTING
Information Patent Application
ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE
- Publication number 20180252769
- Publication date Sep 6, 2018
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE RECIRCULATION TEST SUPPORT FOR INTEGRATED CIRCUITS
- Publication number 20180238964
- Publication date Aug 23, 2018
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURALLY ASSISTED FUNCTIONAL TEST AND DIAGNOSTICS FOR INTEGRATE...
- Publication number 20180238962
- Publication date Aug 23, 2018
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTE...
- Publication number 20180075170
- Publication date Mar 15, 2018
- International Business Machines Corporation
- Mary P. Kusko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MAN...
- Publication number 20180067162
- Publication date Mar 8, 2018
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN TESTING OF INDIVIDUALLY PERSONALIZED SEMICONDUCTOR DEVICE C...
- Publication number 20170370988
- Publication date Dec 28, 2017
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN DEVICE TESTING OF INTEGRATED CIRCUITS
- Publication number 20170343601
- Publication date Nov 30, 2017
- International Business Machines Corporation
- Robert M. Casatuta
- G01 - MEASURING TESTING
Information Patent Application
PERFORMING SYSTEM FUNCTIONAL TEST ON A CHIP HAVING PARTIAL-GOOD POR...
- Publication number 20170261551
- Publication date Sep 14, 2017
- International Business Machines Corporation
- Mitesh A. Agrawal
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR PERFORMING TEST AND CALIBRATION OF INTEGRAT...
- Publication number 20170261354
- Publication date Sep 14, 2017
- International Business Machines Corporation
- Mitesh Agrawal
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MAN...
- Publication number 20170261552
- Publication date Sep 14, 2017
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MAN...
- Publication number 20170261554
- Publication date Sep 14, 2017
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Application
ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE
- Publication number 20170219651
- Publication date Aug 3, 2017
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTE...
- Publication number 20170199946
- Publication date Jul 13, 2017
- International Business Machines Corporation
- Mary P. Kusko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURE CREDIT CARD WITH NEAR FIELD COMMUNICATIONS
- Publication number 20160148193
- Publication date May 26, 2016
- eBay Inc.
- Edward E. Kelley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP AUTHENTICATION USING SCAN CHAINS
- Publication number 20150219718
- Publication date Aug 6, 2015
- International Business Machines Corporation
- FRANCO MOTIKA
- G01 - MEASURING TESTING
Information Patent Application
SECURE CREDIT CARD WITH NEAR FIELD COMMUNICATIONS
- Publication number 20150012440
- Publication date Jan 8, 2015
- eBay Inc.
- Edward E. Kelley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROTECTING CONFIDENTIAL CONTENT IN A USER INTERFACE
- Publication number 20150007346
- Publication date Jan 1, 2015
- International Business Machines Corporation
- David J. Delia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RULES DRIVEN MULTIPLE PASSWORDS
- Publication number 20140325591
- Publication date Oct 30, 2014
- Wayne M. Delia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USER-AUTHENTICATING, DIGITAL DATA RECORDING PEN
- Publication number 20140029811
- Publication date Jan 30, 2014
- International Business Machines Corporation
- Wayne M. DELIA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNATURE COMPRESSION REGISTER INSTABILITY ISOLATION AND STABLE SIG...
- Publication number 20140006889
- Publication date Jan 2, 2014
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Application
GUI POINTER AUTOMATIC POSITION VECTORING
- Publication number 20130305193
- Publication date Nov 14, 2013
- Edward E. Kelley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP AUTHENTICATION USING SCAN CHAINS
- Publication number 20130198873
- Publication date Aug 1, 2013
- International Business Machines Corporation
- FRANCO MOTIKA
- G01 - MEASURING TESTING

Franco Motika

Person

Patents Grantslast 30 patents

User privacy for autonomous vehicles

Secure credit card with near field communications

Dynamic weight selection process for logic built-in self test

Empirical LBIST latch switching and state probability determination

Logic built-in self test dynamic weight selection method

Iterative functional test exerciser reload and execution

Built-in device testing of integrated circuits

Non-destructive recirculation test support for integrated circuits

Methods and systems for performing test and calibration of integrat...

Functional diagnostics based on dynamic selection of alternate cloc...

Performing system functional test on a chip having partial-good por...

Functional diagnostics based on dynamic selection of alternate cloc...

Methods and systems for performing test and calibration of integrat...

Iterative N-detect based logic diagnostic technique

Structurally assisted functional test and diagnostics for integrate...

Methods and systems for generating functional test patterns for man...

Methods and systems for generating functional test patterns for man...

Dynamic fault model generation for diagnostics simulation and patte...

Iterative N-detect based logic diagnostic technique

Methods and systems for generating functional test patterns for man...

Dynamic fault model generation for diagnostics simulation and patte...

Optimizing generation of test configurations for built-in self-testing

Dynamic fault model generation for diagnostics simulation and patte...

Chip authentication using scan chains

Secure credit card with near field communications

Rules driven multiple passwords

GUI pointer automatic position vectoring

Chip authentication using scan chains

Method and system of preserving purchased on-demand transportation...

Method and system for preventing password theft through unauthorize...

Patents Applicationslast 30 patents

USER PRIVACY FOR AUTONOMOUS VEHICLES

EMPIRICAL LBIST LATCH SWITCHING AND STATE PROBABILITY DETERMINATION

DYNAMIC WEIGHT SELECTION PROCESS FOR LOGIC BUILT-IN SELF TEST

LOGIC BUILT-IN SELF TEST DYNAMIC WEIGHT SELECTION METHOD

ITERATIVE FUNCTIONAL TEST EXERCISER RELOAD AND EXECUTION

FUNCTIONAL DIAGNOSTICS BASED ON DYNAMIC SELECTION OF ALTERNATE CLOC...

FUNCTIONAL DIAGNOSTICS BASED ON DYNAMIC SELECTION OF ALTERNATE CLOC...

METHODS AND SYSTEMS FOR PERFORMING TEST AND CALIBRATION OF INTEGRAT...

ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE

NON-DESTRUCTIVE RECIRCULATION TEST SUPPORT FOR INTEGRATED CIRCUITS

STRUCTURALLY ASSISTED FUNCTIONAL TEST AND DIAGNOSTICS FOR INTEGRATE...

DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTE...

METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MAN...

BURN-IN TESTING OF INDIVIDUALLY PERSONALIZED SEMICONDUCTOR DEVICE C...

BUILT-IN DEVICE TESTING OF INTEGRATED CIRCUITS

PERFORMING SYSTEM FUNCTIONAL TEST ON A CHIP HAVING PARTIAL-GOOD POR...

METHODS AND SYSTEMS FOR PERFORMING TEST AND CALIBRATION OF INTEGRAT...

METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MAN...

METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MAN...

ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE

DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTE...

SECURE CREDIT CARD WITH NEAR FIELD COMMUNICATIONS

CHIP AUTHENTICATION USING SCAN CHAINS

SECURE CREDIT CARD WITH NEAR FIELD COMMUNICATIONS

PROTECTING CONFIDENTIAL CONTENT IN A USER INTERFACE

RULES DRIVEN MULTIPLE PASSWORDS

USER-AUTHENTICATING, DIGITAL DATA RECORDING PEN

SIGNATURE COMPRESSION REGISTER INSTABILITY ISOLATION AND STABLE SIG...

GUI POINTER AUTOMATIC POSITION VECTORING

CHIP AUTHENTICATION USING SCAN CHAINS