FRANCO STELLARI

Person

WALDWICK, NJ, US

People

Patents Grantslast 30 patents

Information Patent Grant
RRAM filament spatial localization using a laser stimulation
- Patent number 11,901,002
- Issue date Feb 13, 2024
- International Business Machines Corporation
- Franco Stellari
- G11 - INFORMATION STORAGE
Information Patent Grant
Detection of an aged circuit
- Patent number 11,879,932
- Issue date Jan 23, 2024
- International Business Machines Corporation
- Franco Stellari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
ReRAM analog PUF using filament location
- Patent number 11,864,474
- Issue date Jan 2, 2024
- International Business Machines Corporation
- Takashi Ando
- G11 - INFORMATION STORAGE
Information Patent Grant
Physical unclonable function device with phase change
- Patent number 11,844,293
- Issue date Dec 12, 2023
- International Business Machines Corporation
- Guy M. Cohen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Machine learning-based circuit board inspection
- Patent number 11,715,195
- Issue date Aug 1, 2023
- International Business Machines Corporation
- Franco Stellari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using photonic emission to develop electromagnetic emission models
- Patent number 11,538,147
- Issue date Dec 27, 2022
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
RRAM filament location based on NIR emission
- Patent number 11,508,438
- Issue date Nov 22, 2022
- International Business Machines Corporation
- Franco Stellari
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning methods for creating time-resolved emission images of inte...
- Patent number 11,480,612
- Issue date Oct 25, 2022
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Grant
Creating time-resolved emission images of integrated circuits using...
- Patent number 11,307,250
- Issue date Apr 19, 2022
- International Business Machines Corporation
- Franco Stellari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging integrated circuits using a single-point single-photon dete...
- Patent number 11,287,630
- Issue date Mar 29, 2022
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 11,169,200
- Issue date Nov 9, 2021
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit identification
- Patent number 11,106,764
- Issue date Aug 31, 2021
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of performance degradation in integrated circuits
- Patent number 11,105,856
- Issue date Aug 31, 2021
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 11,061,063
- Issue date Jul 13, 2021
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit identification
- Patent number 11,036,832
- Issue date Jun 15, 2021
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated scan chain diagnostics using emission
- Patent number 10,928,448
- Issue date Feb 23, 2021
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for quickly identifying circuit components in an...
- Patent number 10,895,596
- Issue date Jan 19, 2021
- International Business Machines Corporation
- Peilin Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit defect detection using pattern images
- Patent number 10,755,404
- Issue date Aug 25, 2020
- International Business Machines Corporation
- Chung-Ching Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated focusing of a microscope of an optical inspection system
- Patent number 10,755,397
- Issue date Aug 25, 2020
- International Business Machines Corporation
- Franco Stellari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated scan chain diagnostics using emission
- Patent number 10,591,539
- Issue date Mar 17, 2020
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Grant
Ring oscillator structures to determine local voltage value
- Patent number 10,574,240
- Issue date Feb 25, 2020
- International Business Machines Corporation
- Keith A. Jenkins
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Scan chain latch design that improves testability of integrated cir...
- Patent number 10,571,520
- Issue date Feb 25, 2020
- Internatioanl Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric breakdown monitor
- Patent number 10,564,213
- Issue date Feb 18, 2020
- International Business Machines Corporation
- Tam N. Huynh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Non-destructive analysis to determine use history of processor
- Patent number 10,552,278
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit identification
- Patent number 10,515,181
- Issue date Dec 24, 2019
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit identification
- Patent number 10,515,183
- Issue date Dec 24, 2019
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 10,429,433
- Issue date Oct 1, 2019
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive determination of components of integrated circuits
- Patent number 10,386,409
- Issue date Aug 20, 2019
- International Business Machines Corporation
- Lynne M. Gignac
- G01 - MEASURING TESTING
Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 10,379,152
- Issue date Aug 13, 2019
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Automated scan chain diagnostics using emission
- Patent number 10,302,697
- Issue date May 28, 2019
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RERAM ANALOG PUF USING FILAMENT LOCATION
- Publication number 20230301212
- Publication date Sep 21, 2023
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RRAM FILAMENT SPATIAL LOCALIZATION USING A LASER STIMULATION
- Publication number 20230170019
- Publication date Jun 1, 2023
- International Business Machines Corporation
- Franco Stellari
- G11 - INFORMATION STORAGE
Information Patent Application
PHYSICAL UNCLONABLE FUNCTION DEVICE WITH PHASE CHANGE
- Publication number 20230108998
- Publication date Apr 6, 2023
- International Business Machines Corporation
- Guy M. Cohen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Protecting Against Emission Based Side Channel Detection
- Publication number 20220366113
- Publication date Nov 17, 2022
- International Business Machines Corporation
- Peilin Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING-BASED CIRCUIT BOARD INSPECTION
- Publication number 20220301134
- Publication date Sep 22, 2022
- International Business Machines Corporation
- Franco Stellari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CREATING TIME-RESOLVED EMISSION IMAGES OF INTEGRATED CIRCUITS USING...
- Publication number 20210063481
- Publication date Mar 4, 2021
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Application
IMAGING INTEGRATED CIRCUITS USING A SINGLE-POINT SINGLE-PHOTON DETE...
- Publication number 20210063716
- Publication date Mar 4, 2021
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Application
SCANNING METHODS FOR CREATING TIME-RESOLVED EMISSION IMAGES OF INTE...
- Publication number 20210063482
- Publication date Mar 4, 2021
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS
- Publication number 20200150181
- Publication date May 14, 2020
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF AN AGED CIRCUIT
- Publication number 20200132751
- Publication date Apr 30, 2020
- International Business Machines Corporation
- Franco Stellari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED SCAN CHAIN DIAGNOSTICS USING EMISSION
- Publication number 20200088791
- Publication date Mar 19, 2020
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT IDENTIFICATION AND REVERSE ENGINEERING
- Publication number 20200082053
- Publication date Mar 12, 2020
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USING PHOTONIC EMISSION TO DEVELOP ELECTROMAGNETIC EMISSION MODELS
- Publication number 20200082518
- Publication date Mar 12, 2020
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT IDENTIFICATION AND REVERSE ENGINEERING
- Publication number 20200082054
- Publication date Mar 12, 2020
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS
- Publication number 20190353695
- Publication date Nov 21, 2019
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED FOCUSING OF A MICROSCOPE OF AN OPTICAL INSPECTION SYSTEM
- Publication number 20190325568
- Publication date Oct 24, 2019
- International Business Machines Corporation
- Franco Stellari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS
- Publication number 20190285690
- Publication date Sep 19, 2019
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED SCAN CHAIN DIAGNOSTICS USING EMISSION
- Publication number 20190212388
- Publication date Jul 11, 2019
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEFECT DETECTION USING PATTERN IMAGES
- Publication number 20190180430
- Publication date Jun 13, 2019
- International Business Machines Corporation
- Chung-Ching Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT IDENTIFICATION AND REVERSE ENGINEERING
- Publication number 20180330038
- Publication date Nov 15, 2018
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT IDENTIFICATION AND REVERSE ENGINEERING
- Publication number 20180330037
- Publication date Nov 15, 2018
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR
- Publication number 20180322025
- Publication date Nov 8, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RING OSCILLATOR STRUCTURES TO DETERMINE LOCAL VOLTAGE VALUE
- Publication number 20180248555
- Publication date Aug 30, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIELECTRIC BREAKDOWN MONITOR
- Publication number 20180246159
- Publication date Aug 30, 2018
- International Business Machines Corporation
- Tam N. Huynh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DETECTION OF HARDWARE TROJAN USING LIGHT EMISSIONS WITH SACRIFICIAL...
- Publication number 20180211377
- Publication date Jul 26, 2018
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT TEMPERATURE DETERMINATION USING PHOTON EMISSION...
- Publication number 20180100891
- Publication date Apr 12, 2018
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR
- Publication number 20170329685
- Publication date Nov 16, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED SCAN CHAIN DIAGNOSTICS USING EMISSION
- Publication number 20170147736
- Publication date May 25, 2017
- International Business Machines Corporation
- Franco Stellari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR QUICKLY IDENTIFYING CIRCUIT COMPONENTS IN AN...
- Publication number 20170131350
- Publication date May 11, 2017
- PEILIN SONG
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING
- Publication number 20170122999
- Publication date May 4, 2017
- Jifeng Chen
- G01 - MEASURING TESTING

FRANCO STELLARI

Person

Patents Grantslast 30 patents

RRAM filament spatial localization using a laser stimulation

Detection of an aged circuit

ReRAM analog PUF using filament location

Physical unclonable function device with phase change

Machine learning-based circuit board inspection

Using photonic emission to develop electromagnetic emission models

RRAM filament location based on NIR emission

Scanning methods for creating time-resolved emission images of inte...

Creating time-resolved emission images of integrated circuits using...

Imaging integrated circuits using a single-point single-photon dete...

Method for the characterization and monitoring of integrated circuits

Integrated circuit identification

Detection of performance degradation in integrated circuits

Method for the characterization and monitoring of integrated circuits

Integrated circuit identification

Automated scan chain diagnostics using emission

Method and system for quickly identifying circuit components in an...

Integrated circuit defect detection using pattern images

Automated focusing of a microscope of an optical inspection system

Automated scan chain diagnostics using emission

Ring oscillator structures to determine local voltage value

Scan chain latch design that improves testability of integrated cir...

Dielectric breakdown monitor

Non-destructive analysis to determine use history of processor

Integrated circuit identification

Integrated circuit identification

Method for the characterization and monitoring of integrated circuits

Non-destructive determination of components of integrated circuits

Method for the characterization and monitoring of integrated circuits

Automated scan chain diagnostics using emission

Patents Applicationslast 30 patents

RERAM ANALOG PUF USING FILAMENT LOCATION

RRAM FILAMENT SPATIAL LOCALIZATION USING A LASER STIMULATION

PHYSICAL UNCLONABLE FUNCTION DEVICE WITH PHASE CHANGE

Protecting Against Emission Based Side Channel Detection

MACHINE LEARNING-BASED CIRCUIT BOARD INSPECTION

CREATING TIME-RESOLVED EMISSION IMAGES OF INTEGRATED CIRCUITS USING...

IMAGING INTEGRATED CIRCUITS USING A SINGLE-POINT SINGLE-PHOTON DETE...

SCANNING METHODS FOR CREATING TIME-RESOLVED EMISSION IMAGES OF INTE...

DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS

DETECTION OF AN AGED CIRCUIT

AUTOMATED SCAN CHAIN DIAGNOSTICS USING EMISSION

INTEGRATED CIRCUIT IDENTIFICATION AND REVERSE ENGINEERING

USING PHOTONIC EMISSION TO DEVELOP ELECTROMAGNETIC EMISSION MODELS

INTEGRATED CIRCUIT IDENTIFICATION AND REVERSE ENGINEERING

METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS

AUTOMATED FOCUSING OF A MICROSCOPE OF AN OPTICAL INSPECTION SYSTEM

METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS

AUTOMATED SCAN CHAIN DIAGNOSTICS USING EMISSION

INTEGRATED CIRCUIT DEFECT DETECTION USING PATTERN IMAGES

INTEGRATED CIRCUIT IDENTIFICATION AND REVERSE ENGINEERING

INTEGRATED CIRCUIT IDENTIFICATION AND REVERSE ENGINEERING

NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR

RING OSCILLATOR STRUCTURES TO DETERMINE LOCAL VOLTAGE VALUE

DIELECTRIC BREAKDOWN MONITOR

DETECTION OF HARDWARE TROJAN USING LIGHT EMISSIONS WITH SACRIFICIAL...

INTEGRATED CIRCUIT TEMPERATURE DETERMINATION USING PHOTON EMISSION...

NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR

AUTOMATED SCAN CHAIN DIAGNOSTICS USING EMISSION

METHOD AND SYSTEM FOR QUICKLY IDENTIFYING CIRCUIT COMPONENTS IN AN...

INTEGRATED TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING