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Franco Zappa
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Milano, IT
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for detection, localization and signaling of sing...
Patent number
12,135,238
Issue date
Nov 5, 2024
Politecnico di Milano
Federica Alberta Villa
G01 - MEASURING TESTING
Information
Patent Grant
Distance measuring device and distance measuring method
Patent number
11,762,070
Issue date
Sep 19, 2023
Omron Corporation
Yuki Matsui
G01 - MEASURING TESTING
Information
Patent Grant
Distance measuring device
Patent number
11,520,047
Issue date
Dec 6, 2022
Omron Corporation
Yuki Matsui
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for creating time-resolved emission images of...
Patent number
8,115,170
Issue date
Feb 14, 2012
International Business Machines Corporation
Franco Stellari
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasensitive photodetector with integrated pinhole for confocal m...
Patent number
6,995,444
Issue date
Feb 7, 2006
Carl Zeiss Jena GmbH
Sergio Cova
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Monolithic circuit of active quenching and active reset for avalanc...
Patent number
6,541,752
Issue date
Apr 1, 2003
Politecnico di Milano
Franco Zappa
G01 - MEASURING TESTING
Information
Patent Grant
Circuit for high precision detection of the time of arrival of phot...
Patent number
6,384,663
Issue date
May 7, 2002
Politecnico de Milano
Sergio Cova
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND APPARATUS FOR SINGLE-SHOT TIME-OF-FLIGHT RANGING WITH B...
Publication number
20240361437
Publication date
Oct 31, 2024
Huawei Technologies Co., Ltd
Alfonso INCORONATO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETECTION, LOCALIZATION AND SIGNALING OF SING...
Publication number
20240175748
Publication date
May 30, 2024
Politecnico Di Milano
Federica Alberta VILLA
G01 - MEASURING TESTING
Information
Patent Application
WIDE-AREA SINGLE-PHOTON DETECTOR WITH TIME-GATING CAPABILITY
Publication number
20220069152
Publication date
Mar 3, 2022
Politecnico Di Milano
Alberto Tosi
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASURING DEVICE AND DISTANCE MEASURING METHOD
Publication number
20200064451
Publication date
Feb 27, 2020
Omron Corporation
Yuki MATSUI
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASURING DEVICE
Publication number
20200049822
Publication date
Feb 13, 2020
Omron Corporation
Yuki MATSUI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CREATING TIME-RESOLVED EMISSION IMAGES OF...
Publication number
20080164414
Publication date
Jul 10, 2008
FRANCO STELLARI
G02 - OPTICS
Information
Patent Application
Ultrasensitive photodetector with integrated pinhole for confocal m...
Publication number
20030160250
Publication date
Aug 28, 2003
Sergio Cova
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Monolithic circuit of active quenching and active reset for avalanc...
Publication number
20010020673
Publication date
Sep 13, 2001
Franco Zappa
G01 - MEASURING TESTING
Information
Patent Application
Circuit for high precision detection of the time of arrival of phot...
Publication number
20010020863
Publication date
Sep 13, 2001
Sergio Cova
G01 - MEASURING TESTING