TREA

Francois A. Mesqui

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  • Palo Alto, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Nonintrusive inspection system
    • Patent number 7,050,536
    • Issue date May 23, 2006
    • InVision Technologies, Inc.
    • Gerhard Fenkart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Nonintrusive inspection apparatus
    • Patent number 6,957,913
    • Issue date Oct 25, 2005
    • InVision Technologies, Inc.
    • Gerhard Renkart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Multi-view x-ray imaging of logs
    • Patent number 6,757,354
    • Issue date Jun 29, 2004
    • InVision Technologies, Inc.
    • Sondre Skatter
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Nonintrusive inspection apparatus
    • Patent number 6,707,875
    • Issue date Mar 16, 2004
    • InVision Technologies, Inc.
    • Gerhard Fenkart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Nonintrusive inspection apparatus
    • Patent number 6,647,091
    • Issue date Nov 11, 2003
    • InVision Technologies, Inc.
    • Gerhard Fenkart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Nonintrusive inspection system
    • Patent number 6,590,956
    • Issue date Jul 8, 2003
    • InVision Technologies, Inc.
    • Gerhard Fenkart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Nonintrusive inspection system
    • Patent number 6,430,255
    • Issue date Aug 6, 2002
    • InVision Technologies, Inc.
    • Gerhard Fenkart
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents