Francois Berger

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Saint Chef, FR

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for inspecting semiconductor wafers
- Patent number 9,007,456
- Issue date Apr 14, 2015
- Altatech Semiconductor
- Philippe Gastaldo
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting surface defects on a substrate and device usin...
- Patent number 7,812,942
- Issue date Oct 12, 2010
- S.O.I. Tec Silicon on Insulator Technologies
- Cécile Moulin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20110128371
- Publication date Jun 2, 2011
- Philippe Gastaldo
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING SURFACE DEFECTS ON A SUBSTRATE AND DEVICE USIN...
- Publication number 20090051930
- Publication date Feb 26, 2009
- S. O. I. Tec Silicon on Insulator Technologies
- Cecile Moulin
- G01 - MEASURING TESTING