Francois Costa De Beauregard

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Paris, FR

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Patents Grantslast 30 patents

Information Patent Grant
Electron beam integrated circuit tester
- Patent number 4,779,046
- Issue date Oct 18, 1988
- CAMECA
- Jean-Michel Rouberoi
- G01 - MEASURING TESTING
Information Patent Grant
High clarity mass spectrometer capable of multiple simultaneous det...
- Patent number 4,638,160
- Issue date Jan 20, 1987
- Office National d'Etudes et de Recherche Aerospatiales (ONERA)
- Georges Slodzian
- H01 - BASIC ELECTRIC ELEMENTS