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Francois PIETTE
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Neuville-en-Condroz, BE
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Patents Grants
last 30 patents
Information
Patent Grant
System for characterizing a transistor circuit
Patent number
12,282,054
Issue date
Apr 22, 2025
Melexis Technologies NV
Francois Piette
G01 - MEASURING TESTING
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Patent Grant
Device and method for absolute voltage measurement
Patent number
10,879,920
Issue date
Dec 29, 2020
Melexis Technologies NV
Viktor Kassovski
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SYSTEM FOR CHARACTERIZING A TRANSISTOR CIRCUIT
Publication number
20240159820
Publication date
May 16, 2024
MELEXIS TECHNOLOGIES NV
Francois PIETTE
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR ABSOLUTE VOLTAGE MEASUREMENT
Publication number
20200099384
Publication date
Mar 26, 2020
MELEXIS TECHNOLOGIES NV
Viktor KASSOVSKI
G01 - MEASURING TESTING