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Francois R. Gaultier
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Oakland, CA, US
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last 30 patents
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Patent Grant
Reduced-size apparatus for non-intrusively inspecting an object
Patent number
7,027,554
Issue date
Apr 11, 2006
InVision Technologies, Inc.
François R. Gaultier
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SYSTEMS AND METHOD FOR SCANNING A CONTINUOUS STREAM OF OBJECTS
Publication number
20100230242
Publication date
Sep 16, 2010
Samit Kumar Basu
G01 - MEASURING TESTING
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Patent Application
Reduced-size apparatus for non-intrusively inspecting an object
Publication number
20050190879
Publication date
Sep 1, 2005
Francois R. Gaultier
G01 - MEASURING TESTING
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Patent Application
Apparatus and method for nonintrusively inspecting an object
Publication number
20050185757
Publication date
Aug 25, 2005
David E. Kresse
G01 - MEASURING TESTING