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Frank C. Demarest
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Higganum, CT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Non-harmonic cyclic error compensation in interferometric encoder s...
Patent number
9,146,093
Issue date
Sep 29, 2015
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Grant
Cyclic error compensation in interferometric encoder systems
Patent number
8,913,226
Issue date
Dec 16, 2014
Zygo Corpporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Grant
Cyclic error compensation in interferometry systems
Patent number
7,616,322
Issue date
Nov 10, 2009
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Cyclic error compensation in interferometry systems
Patent number
7,576,868
Issue date
Aug 18, 2009
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Grant
Data age compensation with avalanche photodiode
Patent number
7,542,147
Issue date
Jun 2, 2009
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Grant
Cyclic error compensation in interferometry systems
Patent number
7,428,685
Issue date
Sep 23, 2008
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Grant
Glitch filter for distance measuring interferometry
Patent number
6,975,406
Issue date
Dec 13, 2005
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Grant
Data age adjustments
Patent number
6,597,459
Issue date
Jul 22, 2003
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer and method for measuring the refractive index and op...
Patent number
6,529,279
Issue date
Mar 4, 2003
Zygo Corporation
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer and method for measuring the refractive index and op...
Patent number
6,525,825
Issue date
Feb 25, 2003
Zygo Corporation
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer and method for measuring the refractive index and op...
Patent number
6,525,826
Issue date
Feb 25, 2003
Zygo Corporation
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer and method for measuring the refractive index and op...
Patent number
6,407,816
Issue date
Jun 18, 2002
Zygo Corporation
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer and method for measuring the refractive index and op...
Patent number
6,327,039
Issue date
Dec 4, 2001
Zygo Corporation
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring the refractive index and optical...
Patent number
6,219,144
Issue date
Apr 17, 2001
Zygo Corporation
Henry Allen Hill
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for providing data age compensation in an inte...
Patent number
5,767,972
Issue date
Jun 16, 1998
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optical measuring system
Patent number
4,427,296
Issue date
Jan 24, 1984
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Grant
Edge timing in an optical measuring apparatus
Patent number
4,332,475
Issue date
Jun 1, 1982
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DATA AGE REDUCTION
Publication number
20230366670
Publication date
Nov 16, 2023
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Application
NON-HARMONIC CYCLIC ERROR COMPENSATION IN INTERFEROMETRIC ENCODER S...
Publication number
20130278914
Publication date
Oct 24, 2013
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Application
CYCLIC ERROR COMPENSATION IN INTERFEROMETRIC ENCODER SYSTEMS
Publication number
20120154780
Publication date
Jun 21, 2012
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Application
CYCLIC ERROR COMPENSATION IN INTERFEROMETRY SYSTEMS
Publication number
20080304077
Publication date
Dec 11, 2008
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Application
Data age compensation with avalanche photodiode
Publication number
20070127035
Publication date
Jun 7, 2007
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Application
Cyclic Error Compensation in Interferometry Systems
Publication number
20070008547
Publication date
Jan 11, 2007
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Cyclic error compensation in interferometry systems
Publication number
20050166118
Publication date
Jul 28, 2005
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Application
Glitch filter for distance measuring interferometry
Publication number
20030025914
Publication date
Feb 6, 2003
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Application
Interferometer and method for measuring the refractive index and op...
Publication number
20020140946
Publication date
Oct 3, 2002
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Application
Interferometer and method for measuring the refractive index and op...
Publication number
20020140945
Publication date
Oct 3, 2002
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Application
Interferometer and method for measuring the refractive index and op...
Publication number
20020131053
Publication date
Sep 19, 2002
Peter De Groot
G01 - MEASURING TESTING
Information
Patent Application
Data age adjustments
Publication number
20020021449
Publication date
Feb 21, 2002
Frank C. Demarest
G01 - MEASURING TESTING