Frank C. Mielke

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Willich, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for testing a component, method of testing the component,...
- Patent number 12,339,308
- Issue date Jun 24, 2025
- Advantest Corporation
- Frank Mielke
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit, an apparatus for testing an integrated circuit,...
- Patent number 12,306,250
- Issue date May 20, 2025
- Advantest Corporation
- Frank Mielke
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring the current consumption and the...
- Patent number 7,646,206
- Issue date Jan 12, 2010
- Infineon Technologies AG
- Frank C. Mielke
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR TESTING A COMPONENT, METHOD OF TESTING THE COMPONENT,...
- Publication number 20230119550
- Publication date Apr 20, 2023
- Advantest Corporation
- Frank Mielke
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT, AN APPARATUS FOR TESTING AN INTEGRATED CIRCUIT,...
- Publication number 20230099503
- Publication date Mar 30, 2023
- Advantest Corporation
- Frank Mielke
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring the current consumption and the...
- Publication number 20080204045
- Publication date Aug 28, 2008
- Infineon Technologies AG
- Frank C. Mielke
- G01 - MEASURING TESTING