Frank C. Seelmann

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Gardiner, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for testing multi-chip integrated circuit modules
- Patent number 6,984,997
- Issue date Jan 10, 2006
- International Business Machines Corporation
- Yuet-Ying Yu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system of testing complex MCM's
- Publication number 20050104608
- Publication date May 19, 2005
- International Business Machines Corporation
- Yuet-Ying Yu
- G01 - MEASURING TESTING