Frank Dornseifer

Person

  • Freising, DE

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    DIGITAL LDO PASSGATE ROTATION

    • Publication number 20220374035
    • Publication date Nov 24, 2022
    • TEXAS INSTRUMENTS INCORPORATED
    • Johannes GERBER
    • G05 - CONTROLLING REGULATING
  • Information Patent Application

    Bandgap Reference Voltage Failure Detection

    • Publication number 20190278315
    • Publication date Sep 12, 2019
    • TEXAS INSTRUMENTS INCORPORATED
    • Frank Dornseifer
    • G05 - CONTROLLING REGULATING
  • Information Patent Application

    Bandgap Reference Voltage Failure Detection

    • Publication number 20170147027
    • Publication date May 25, 2017
    • Texas Instruments Deutschland GmbH
    • Frank Dornseifer
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROGRAMMABLE SUPPLY DOMAIN PULLDOWN

    • Publication number 20150378374
    • Publication date Dec 31, 2015
    • Texas Instruments Deutschland GmbH
    • Matthias ARNOLD
    • G05 - CONTROLLING REGULATING
  • Information Patent Application

    Bandgap Reference Voltage Failure Detection

    • Publication number 20150286236
    • Publication date Oct 8, 2015
    • Texas Instruments Deutschland GmbH
    • Frank Dornseifer
    • G05 - CONTROLLING REGULATING
  • Information Patent Application

    Output Driver for Energy Recovery from Inductor Based Sensor

    • Publication number 20140240008
    • Publication date Aug 28, 2014
    • TEXAS INSTRUMENTS DEUTSCLAND GMBH
    • Frank Dornseifer
    • H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
  • Information Patent Application

    Power-Gated Electronic Device

    • Publication number 20130271103
    • Publication date Oct 17, 2013
    • TEXAS INSTRUMENTS INCORPORATED
    • Johannes Gerber
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Adaptively Biased Comparator

    • Publication number 20120062279
    • Publication date Mar 15, 2012
    • Texas Instruments Deutschland GmbH
    • Rüdiger Kuhn
    • G01 - MEASURING TESTING