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Frank Eisenkramer
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Biebertal, DE
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Patents Grants
last 30 patents
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Patent Grant
Device for stretching sample sections
Patent number
8,999,269
Issue date
Apr 7, 2015
Leica Microsystems CMS GmbH
Ralf Unger
G01 - MEASURING TESTING
Information
Patent Grant
Inspection microscope for several wavelength ranges and reflection...
Patent number
7,274,505
Issue date
Sep 25, 2007
Leica Microsystems CMS GmbH
Frank Eisenkrämer
G02 - OPTICS
Information
Patent Grant
Absorbent thin-film system consisting of metal and dielectric films
Patent number
6,627,304
Issue date
Sep 30, 2003
Leica Microsystems Wetzlar GmbH
Frank Eisenkrämer
G02 - OPTICS
Information
Patent Grant
Illumination device for a DUV microscope and DUV microscope
Patent number
6,624,930
Issue date
Sep 23, 2003
Leica Microsystems Wetzlar GmbH
Lambert Danner
G02 - OPTICS
Patents Applications
last 30 patents
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Patent Application
DEVICE FOR STRETCHING SAMPLE SECTIONS
Publication number
20130287649
Publication date
Oct 31, 2013
Leica Microsystems CMS GmbH
Ralf Unger
G01 - MEASURING TESTING
Information
Patent Application
Inspection microscope for several wavelength ranges and reflection...
Publication number
20040145803
Publication date
Jul 29, 2004
Frank Eisenkramer
G02 - OPTICS