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Frank EVERTS
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Eindhoven, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Reducing speckle in an excimer light source
Patent number
11,686,951
Issue date
Jun 27, 2023
Cymer, LLC
Wilhelmus Patrick Elisabeth Maria op 't Root
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reducing speckle in an excimer light source
Patent number
11,054,665
Issue date
Jul 6, 2021
Cymer, LLC
Wilhelmus Patrick Elisabeth Maria op 't Root
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Online calibration for repetition rate dependent performance variables
Patent number
11,050,213
Issue date
Jun 29, 2021
Cymer, LLC
Joshua Jon Thornes
G01 - MEASURING TESTING
Information
Patent Grant
Online calibration for repetition rate dependent performance variables
Patent number
10,727,642
Issue date
Jul 28, 2020
Cymer, LLC
Joshua Jon Thornes
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic apparatus and method
Patent number
10,627,724
Issue date
Apr 21, 2020
ASML Netherlands B.V.
Frank Everts
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Reducing speckle in an excimer light source
Patent number
10,451,890
Issue date
Oct 22, 2019
Cymer, LLC
Wilhelmus Patrick Elisabeth Maria op 't Root
G01 - MEASURING TESTING
Information
Patent Grant
Online calibration for repetition rate dependent performance variables
Patent number
9,762,023
Issue date
Sep 12, 2017
Cymer, LLC
Joshua Jon Thornes
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of controlling a radiation source and lithographic apparatus...
Patent number
9,645,510
Issue date
May 9, 2017
ASML Netherlands B.V.
Wilhelmus Patrick Elisabeth Maria Op 'T Root
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
REDUCING SPECKLE IN AN EXCIMER LIGHT SOURCE
Publication number
20210239998
Publication date
Aug 5, 2021
CYMER, LLC
Wilhelmus Patrick Elisabeth Maria op `t Root
G01 - MEASURING TESTING
Information
Patent Application
Control System and Method
Publication number
20200401050
Publication date
Dec 24, 2020
ASML NETHERLANDS B.V.
Herman Philip GODFRIED
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
ONLINE CALIBRATION FOR REPETITION RATE DEPENDENT PERFORMANCE VARIABLES
Publication number
20200321746
Publication date
Oct 8, 2020
CYMER, LLC
Joshua Jon THORNES
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REDUCING SPECKLE IN AN EXCIMER LIGHT SOURCE
Publication number
20190324286
Publication date
Oct 24, 2019
CYMER, LLC
Wilhelmus Patrick Elisabeth Maria op `t Root
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LITHOGRAPHIC APPARATUS AND METHOD
Publication number
20180253014
Publication date
Sep 6, 2018
ASML NETHERLANDS B.V.
Frank EVERTS
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
REDUCING SPECKLE IN AN EXCIMER LIGHT SOURCE
Publication number
20180203248
Publication date
Jul 19, 2018
CYMER, LLC
Wilhelmus Patrick Elisabeth Maria op `t Root
G02 - OPTICS
Information
Patent Application
ONLINE CALIBRATION FOR REPETITION RATE DEPENDENT PERFORMANCE VARIABLES
Publication number
20180006425
Publication date
Jan 4, 2018
CYMER, LLC
Joshua Jon Thornes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ONLINE CALIBRATION FOR REPETITION RATE DEPENDENT PERFORMANCE VARIABLES
Publication number
20170179677
Publication date
Jun 22, 2017
CYMER, LLC
Joshua Jon THORNES
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF CONTROLLING A RADIATION SOURCE AND LITHOGRAPHIC APPARATUS...
Publication number
20160070179
Publication date
Mar 10, 2016
ASML NETHERLANDS B.V.
Wilhelmus Patrick Elisabeth Maria OP 'T ROOT
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY