Frank Fehrmann

Person

Priestewitz OT Basslitz, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor inspecting method for ensuring scrubbing length on pad
- Patent number 11,703,541
- Issue date Jul 18, 2023
- Volker Hansel
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspecting method
- Patent number 11,693,050
- Issue date Jul 4, 2023
- Volker Hansel
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for providing wafer access in a wafer processin...
- Patent number 9,373,533
- Issue date Jun 21, 2016
- Cascade Microtech, Inc.
- Frank Fehrmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for contacting a row of contact areas with probe...
- Patent number 9,110,131
- Issue date Aug 18, 2015
- Cascade Microtech, Inc.
- Claus Dietrich
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing electronic components of a repetitive pattern un...
- Patent number 8,368,413
- Issue date Feb 5, 2013
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Method for measurement of a device under test
- Patent number 7,573,283
- Issue date Aug 11, 2009
- SUSS Micro Tec Test Systems GmbH
- Axel Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Method and prober for contacting a contact area with a contact tip
- Patent number 7,057,408
- Issue date Jun 6, 2006
- SUSS MicroTec Test Systems (GmbH)
- Stefan Schneidewind
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INSPECTING METHOD FOR ENSURING SCRUBBING LENGTH ON PAD
- Publication number 20220155365
- Publication date May 19, 2022
- MPI CORPORATION
- Volker Hansel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTING METHOD
- Publication number 20220155366
- Publication date May 19, 2022
- MPI CORPORATION
- Volker Hansel
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PROVIDING WAFER ACCESS IN A WAFER PROCESSIN...
- Publication number 20140186145
- Publication date Jul 3, 2014
- Cascade Microtech, Inc.
- Frank Fehrmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR CONTACTING A ROW OF CONTACT AREAS WITH PROBE...
- Publication number 20130027070
- Publication date Jan 31, 2013
- CASCADE MICROTECH INC
- Claus Dietrich
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UN...
- Publication number 20110221461
- Publication date Sep 15, 2011
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMPROVED UTILIZATION OF SEMICONDUCTOR MATERIAL
- Publication number 20100029022
- Publication date Feb 4, 2010
- SUSS MicroTec Test Systems GmbH
- Frank FEHRMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST
- Publication number 20080315903
- Publication date Dec 25, 2008
- SUSS MicroTec Test Systems GmbH
- Axel SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROL OF A POSITIONING DEVICE
- Publication number 20080284457
- Publication date Nov 20, 2008
- SUSS MicroTec Test Systems GmbH
- Ulf HACKIUS
- G01 - MEASURING TESTING
Information Patent Application
Method and prober for contacting a contact area with a contact tip
- Publication number 20050007135
- Publication date Jan 13, 2005
- Stefan Schneidewind
- G01 - MEASURING TESTING

Frank Fehrmann

Person

Patents Grantslast 30 patents

Semiconductor inspecting method for ensuring scrubbing length on pad

Semiconductor inspecting method

Systems and methods for providing wafer access in a wafer processin...

Method and device for contacting a row of contact areas with probe...

Method for testing electronic components of a repetitive pattern un...

Method for measurement of a device under test

Method and prober for contacting a contact area with a contact tip

Patents Applicationslast 30 patents

SEMICONDUCTOR INSPECTING METHOD FOR ENSURING SCRUBBING LENGTH ON PAD

SEMICONDUCTOR INSPECTING METHOD

SYSTEMS AND METHODS FOR PROVIDING WAFER ACCESS IN A WAFER PROCESSIN...

METHOD AND DEVICE FOR CONTACTING A ROW OF CONTACT AREAS WITH PROBE...

METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UN...

METHOD FOR IMPROVED UTILIZATION OF SEMICONDUCTOR MATERIAL

METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST

METHOD AND APPARATUS FOR CONTROL OF A POSITIONING DEVICE

Method and prober for contacting a contact area with a contact tip