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Frank Frederick
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Latch circuitry for memory applications
Patent number
11,568,926
Issue date
Jan 31, 2023
ARM Limited
Andy Wangkun Chen
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory testing techniques
Patent number
11,315,654
Issue date
Apr 26, 2022
ARM Limited
Andy Wangkun Chen
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory embedded full scan for latent defects
Patent number
11,280,832
Issue date
Mar 22, 2022
ARM Limited
Andy Wangkun Chen
G11 - INFORMATION STORAGE
Information
Patent Grant
Latch circuitry for memory applications
Patent number
10,847,211
Issue date
Nov 24, 2020
ARM Limited
Andy Wangkun Chen
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Scan cell for dual port memory applications
Patent number
10,222,418
Issue date
Mar 5, 2019
ARM Limited
Yew Keong Chong
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for memory self testing
Patent number
7,434,119
Issue date
Oct 7, 2008
ARM Limited
Richard Slobodnik
G11 - INFORMATION STORAGE
Information
Patent Grant
Clock control of a multiple clock domain data processor
Patent number
7,330,994
Issue date
Feb 12, 2008
ARM Limited
Frank David Frederick
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit and method for testing memory on the integrated...
Patent number
7,308,623
Issue date
Dec 11, 2007
ARM Limited
Richard Slobodnik
G11 - INFORMATION STORAGE
Information
Patent Grant
Testing memory access signal connections
Patent number
6,999,900
Issue date
Feb 14, 2006
ARM Limited
Teresa Louise McLaurin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scan clock circuit and method therefor
Patent number
6,877,123
Issue date
Apr 5, 2005
Freescale Semiconductors, Inc.
Thomas K. Johnston
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEMORY EMBEDDED FULL SCAN FOR LATENT DEFECTS
Publication number
20220074988
Publication date
Mar 10, 2022
Andy Wangkun Chen
G11 - INFORMATION STORAGE
Information
Patent Application
Latch Circuitry for Memory Applications
Publication number
20210074353
Publication date
Mar 11, 2021
ARM Limited
Andy Wangkun Chen
G11 - INFORMATION STORAGE
Information
Patent Application
Memory Testing Techniques
Publication number
20200111537
Publication date
Apr 9, 2020
ARM Limited
Andy Wangkun Chen
G11 - INFORMATION STORAGE
Information
Patent Application
Latch Circuitry for Memory Applications
Publication number
20190325947
Publication date
Oct 24, 2019
ARM Limited
Andy Wangkun Chen
G11 - INFORMATION STORAGE
Information
Patent Application
Scan Cell for Dual Port Memory Applications
Publication number
20180156866
Publication date
Jun 7, 2018
ARM Limited
Yew Keong Chong
G01 - MEASURING TESTING
Information
Patent Application
Clock control of a multiple clock domain data processor
Publication number
20060242449
Publication date
Oct 26, 2006
ARM Limited
Frank David Frederick
G01 - MEASURING TESTING
Information
Patent Application
Integrated circuit and method for testing memory on the integrated...
Publication number
20060212764
Publication date
Sep 21, 2006
ARM Limited
Richard Slobodnik
G11 - INFORMATION STORAGE
Information
Patent Application
Method and apparatus for memory self testing
Publication number
20060200713
Publication date
Sep 7, 2006
ARM Limited
Richard Slobodnik
G11 - INFORMATION STORAGE
Information
Patent Application
Testing memory access signal connections
Publication number
20050222809
Publication date
Oct 6, 2005
ARM Limited
Teresa Louise McLaurin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Scan clock circuit and method therefor
Publication number
20030115524
Publication date
Jun 19, 2003
Thomas K. Johnston
G01 - MEASURING TESTING