Frank Gossett

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Palm Harbor, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for elevated temperature measurement with probes...
- Patent number 6,771,091
- Issue date Aug 3, 2004
- Semiconductor Diagnostics, Inc.
- Jacek J. Lagowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for elevated temperature measurement with probes...
- Publication number 20040057497
- Publication date Mar 25, 2004
- Jacek J. Lagowski
- G01 - MEASURING TESTING