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Frank Heinlein
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Dresden, DE
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Patents Grants
last 30 patents
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Patent Grant
Method of forming a substrate contact in a field effect transistor...
Patent number
6,720,242
Issue date
Apr 13, 2004
Advanced Micro Devices, Inc.
Gert Burbach
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Method of inspecting a depth of an opening of a dielectric material...
Patent number
6,365,423
Issue date
Apr 2, 2002
Advanced Micro Devices, Inc.
Frank Heinlein
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Method of forming a substrate contact in a field effect transistor...
Publication number
20020055244
Publication date
May 9, 2002
Gert Burbach
H01 - BASIC ELECTRIC ELEMENTS