Frank LAUBE

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Burghausen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for monitoring the operational state of a surface inspection...
- Patent number 9,835,567
- Issue date Dec 5, 2017
- Siltronic AG
- Frank Laube
- G01 - MEASURING TESTING
Information Patent Grant
Epitaxially coated silicon wafer and method for producing an epitax...
- Patent number 8,304,860
- Issue date Nov 6, 2012
- Siltronic AG
- Friedrich Passek
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
Method For Monitoring The Operational State Of A Surface Inspectio...
- Publication number 20160041107
- Publication date Feb 11, 2016
- Siltronic AG
- Frank LAUBE
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus For Examining A Semiconductor Wafer
- Publication number 20120007978
- Publication date Jan 12, 2012
- Siltronic AG
- Friedrich Passek
- G01 - MEASURING TESTING
Information Patent Application
Epitaxially coated silicon wafer and method for producing an epitax...
- Publication number 20100224964
- Publication date Sep 9, 2010
- Siltronic AG
- Friedrich Passek
- C30 - CRYSTAL GROWTH