Frank-Michael Werner

Person

Dresden, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Prober for testing devices in a repeat structure on a substrate
- Patent number 9,983,232
- Issue date May 29, 2018
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing devices in a repeat structure on a substrate
- Patent number 8,841,932
- Issue date Sep 23, 2014
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing devices in a repeat structure on a substrate
- Patent number 7,932,737
- Issue date Apr 26, 2011
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlling the temperature of electronic...
- Patent number 7,671,615
- Issue date Mar 2, 2010
- SUSS MicroTec Tech Systems GmbH
- Carel van de Beek
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing substrates
- Patent number 7,196,507
- Issue date Mar 27, 2007
- SUSS MicroTec Testsystems (GmbH)
- Stefan Schneidewind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus for testing substrates at low temperatures
- Patent number 7,046,025
- Issue date May 16, 2006
- SUSS MicroTec Testsystems GmbH
- Stefan Schneidewind
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE
- Publication number 20150008948
- Publication date Jan 8, 2015
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Application
PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE
- Publication number 20110316574
- Publication date Dec 29, 2011
- Frank-Michael WERNER
- G01 - MEASURING TESTING
Information Patent Application
PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE
- Publication number 20090179658
- Publication date Jul 16, 2009
- SUSS MicroTec Test Systems GmbH
- Frank-Michael WERNER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC...
- Publication number 20080042679
- Publication date Feb 21, 2008
- SUSS MicroTec Test Systems GmbH
- Carel van de Beek
- G01 - MEASURING TESTING
Information Patent Application
Arrangement and method for testing substrates under load
- Publication number 20050083037
- Publication date Apr 21, 2005
- Stefan Schneidewind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for testing substrates
- Publication number 20050083036
- Publication date Apr 21, 2005
- Stefan Schneidewind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for testing movement-sensitive substrates
- Publication number 20040119492
- Publication date Jun 24, 2004
- Stefan Schneidewind
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Frank-Michael Werner

Person

Patents Grantslast 30 patents

Prober for testing devices in a repeat structure on a substrate

Prober for testing devices in a repeat structure on a substrate

Prober for testing devices in a repeat structure on a substrate

Method and apparatus for controlling the temperature of electronic...

Apparatus for testing substrates

Test apparatus for testing substrates at low temperatures

Patents Applicationslast 30 patents

PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC...

Arrangement and method for testing substrates under load

Apparatus for testing substrates

Method and apparatus for testing movement-sensitive substrates