Frank Nan ZHANG

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Image contrast enhancement in sample inspection
- Patent number 12,087,542
- Issue date Sep 10, 2024
- ASML Netherlands B.V.
- Yixiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for charged particle flooding to enhance voltag...
- Patent number 11,929,232
- Issue date Mar 12, 2024
- ASML Netherlands B.V.
- Frank Nan Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 11,513,087
- Issue date Nov 29, 2022
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
Image contrast enhancement in sample inspection
- Patent number 11,164,719
- Issue date Nov 2, 2021
- ASML Netherlands B.V.
- Yixiang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for charged particle flooding to enhance voltag...
- Patent number 10,784,077
- Issue date Sep 22, 2020
- ASML Netherlands B.V.
- Frank Nan Zhang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...
- Publication number 20240379325
- Publication date Nov 14, 2024
- ASML NETHERLANDS B.V.
- Frank Nan ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION
- Publication number 20220375712
- Publication date Nov 24, 2022
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE CONTRAST ENHANCEMENT IN SAMPLE INSPECTION
- Publication number 20220122803
- Publication date Apr 21, 2022
- ASML NETHERLANDS B.V.
- Yixiang WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...
- Publication number 20210142979
- Publication date May 13, 2021
- ASML NETHERLANDS B.V.
- Frank Nan ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION
- Publication number 20210116398
- Publication date Apr 22, 2021
- ASML NETHERLANDS B.V.
- Weiming REN
- G01 - MEASURING TESTING
Information Patent Application
IMAGE CONTRAST ENHANCEMENT IN SAMPLE INSPECTION
- Publication number 20200234915
- Publication date Jul 23, 2020
- ASML NETHERLANDS B.V.
- Yixiang WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...
- Publication number 20190043691
- Publication date Feb 7, 2019
- HERMES MICROVISION, INC.
- Frank Nan ZHANG
- H01 - BASIC ELECTRIC ELEMENTS

Frank Nan ZHANG

Person

Patents Grantslast 30 patents

Image contrast enhancement in sample inspection

Systems and methods for charged particle flooding to enhance voltag...

Systems and methods for voltage contrast defect detection

Image contrast enhancement in sample inspection

Systems and methods for charged particle flooding to enhance voltag...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...

SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION

IMAGE CONTRAST ENHANCEMENT IN SAMPLE INSPECTION

SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...

SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION

IMAGE CONTRAST ENHANCEMENT IN SAMPLE INSPECTION

SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...