Frank Nederlof

Follow

Person

Nuenen, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Sample carrier for an electron microscope
- Patent number 9,159,531
- Issue date Oct 13, 2015
- FEI Company
- Frank Nederlof
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle optical system with dual loading options
- Patent number 7,989,778
- Issue date Aug 2, 2011
- FEI Company
- Johannes Antonius Maria Van Den Oetelaar
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
Sample Carrier for an Electron Microscope
- Publication number 20140197311
- Publication date Jul 17, 2014
- FEI Company
- Frank Nederlof
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE OPTICAL SYSTEM WITH DUAL LOADING OPTIONS
- Publication number 20100108907
- Publication date May 6, 2010
- FEI Company
- JOHANNES ANTONIUS MARIA VEN DEN OETELAAR
- H01 - BASIC ELECTRIC ELEMENTS