Frank Nijpels

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Veldwezelt, BE

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Patents Grantslast 30 patents

Information Patent Grant
Preparation of cryogenic sample for charged-particle microscopy
- Patent number 9,116,091
- Issue date Aug 25, 2015
- FEI Company
- Hervé-William Rémigy
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Preparation of Cryogenic Sample for Charged-Particle Microscopy
- Publication number 20150090878
- Publication date Apr 2, 2015
- FEI Company
- Hervé-William Rémigy
- G01 - MEASURING TESTING