Frank O. Uher

Person

Los Altos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,255,903
- Issue date Feb 22, 2022
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 10,852,347
- Issue date Dec 1, 2020
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 10,094,872
- Issue date Oct 9, 2018
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 9,316,683
- Issue date Apr 19, 2016
- AEHR Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 9,151,797
- Issue date Oct 6, 2015
- AEHR Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 8,747,123
- Issue date Jun 10, 2014
- AEHR Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 8,628,336
- Issue date Jan 14, 2014
- AEHR Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 8,506,335
- Issue date Aug 13, 2013
- AEHA Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 8,388,357
- Issue date Mar 5, 2013
- AEHR Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 8,118,618
- Issue date Feb 21, 2012
- AEHR Test Systems
- Donald P. Richmond, II
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 7,762,822
- Issue date Jul 27, 2010
- AEHR Test Systems
- Donald P. Richmond, II
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer burn-in and text employing detachable cartridge
- Patent number 7,541,822
- Issue date Jun 2, 2009
- AEHR Test Systems
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Grant
Contactor assembly for testing electrical circuits
- Patent number 7,301,358
- Issue date Nov 27, 2007
- AEHR Test Systems
- Jovan Jovanovic
- G01 - MEASURING TESTING
Information Patent Grant
Wafer burn-in and test employing detachable cartridge
- Patent number 7,088,117
- Issue date Aug 8, 2006
- Aehr Test System
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Grant
Contactor assembly for testing electrical circuits
- Patent number 6,853,209
- Issue date Feb 8, 2005
- AEHR Test Systems
- Jovan Jovanovic
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level burn-in and test methods
- Patent number 6,580,283
- Issue date Jun 17, 2003
- AEHR Test Systems
- Mark Charles Carbone
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-burn-in and test employing detachable cartridge
- Patent number 6,556,032
- Issue date Apr 29, 2003
- AEHR Test Systems
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Grant
Kinematic coupling
- Patent number 6,413,113
- Issue date Jul 2, 2002
- Aehr Test Systems
- Frank Otto Uher
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wafer-level burn-in and test cartridge
- Patent number 6,340,895
- Issue date Jan 22, 2002
- Aehr Test Systems, Inc.
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Grant
Kinematic coupling
- Patent number 6,217,367
- Issue date Apr 17, 2001
- Aehr Test Systems
- Frank Otto Uher

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20220137121
- Publication date May 5, 2022
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20210025935
- Publication date Jan 28, 2021
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20180372792
- Publication date Dec 27, 2018
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20160187416
- Publication date Jun 30, 2016
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20150369858
- Publication date Dec 24, 2015
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20140232424
- Publication date Aug 21, 2014
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20140091810
- Publication date Apr 3, 2014
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20130304412
- Publication date Nov 14, 2013
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20130141135
- Publication date Jun 6, 2013
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20120113556
- Publication date May 10, 2012
- Aehr Test Systems
- Donald P. Richmond, II
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20100213957
- Publication date Aug 26, 2010
- Aehr Test Systems
- Donald P. Richmond, II
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus for testing electronic devices
- Publication number 20070001790
- Publication date Jan 4, 2007
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Burn-In and Test Employing Detachable Cartridge
- Publication number 20060132154
- Publication date Jun 22, 2006
- Frank O. Uher
- G01 - MEASURING TESTING
Information Patent Application
Contactor assembly for testing electrical circuits
- Publication number 20050057270
- Publication date Mar 17, 2005
- Jovan Jovanovic
- G01 - MEASURING TESTING
Information Patent Application
Wafer burn-in and test employing detachable cartridge
- Publication number 20040046578
- Publication date Mar 11, 2004
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Application
Wafer burn-in and test employing detachable cartridge
- Publication number 20020030502
- Publication date Mar 14, 2002
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Application
KINEMATIC COUPLING
- Publication number 20020002008
- Publication date Jan 3, 2002
- FRANK OTTO UHER
- G01 - MEASURING TESTING

Frank O. Uher

Person

Patents Grantslast 30 patents

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Wafer burn-in and text employing detachable cartridge

Contactor assembly for testing electrical circuits

Wafer burn-in and test employing detachable cartridge

Contactor assembly for testing electrical circuits

Wafer level burn-in and test methods

Wafer-burn-in and test employing detachable cartridge

Kinematic coupling

Wafer-level burn-in and test cartridge

Kinematic coupling

Patents Applicationslast 30 patents

APPARATUS FOR TESTING ELECTRONIC DEVICES

APPARATUS FOR TESTING ELECTRONIC DEVICES

APPARATUS FOR TESTING ELECTRONIC DEVICES

APPARATUS FOR TESTING ELECTRONIC DEVICES

APPARATUS FOR TESTING ELECTRONIC DEVICES

APPARATUS FOR TESTING ELECTRONIC DEVICES

APPARATUS FOR TESTING ELECTRONIC DEVICES

APPARATUS FOR TESTING ELECTRONIC DEVICES

APPARATUS FOR TESTING ELECTRONIC DEVICES

APPARATUS FOR TESTING ELECTRONIC DEVICES

APPARATUS FOR TESTING ELECTRONIC DEVICES

APPARATUS FOR TESTING ELECTRONIC DEVICES

Apparatus for testing electronic devices

Wafer Burn-In and Test Employing Detachable Cartridge

Contactor assembly for testing electrical circuits

Wafer burn-in and test employing detachable cartridge

Wafer burn-in and test employing detachable cartridge

KINEMATIC COUPLING