Frank Olschewski

Person

Heldelberg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method, arrangement, and software for optimizing the image quality...
- Patent number 8,014,624
- Issue date Sep 6, 2011
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for self-monitoring a microscope system, microscope system,...
- Patent number 7,649,682
- Issue date Jan 19, 2010
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for performing interactions on microscopic subjects that cha...
- Patent number 7,471,817
- Issue date Dec 30, 2008
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscope system and method for the analysis and evaluation of mul...
- Patent number 7,394,482
- Issue date Jul 1, 2008
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G01 - MEASURING TESTING
Information Patent Grant
Method for separating fluorescence spectra of dyes present in a sample
- Patent number 7,319,520
- Issue date Jan 15, 2008
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for the analysis of co-localizations
- Patent number 7,282,724
- Issue date Oct 16, 2007
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G01 - MEASURING TESTING
Information Patent Grant
Method for setting a fluorescence spectrum measurement system for m...
- Patent number 7,280,203
- Issue date Oct 9, 2007
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G01 - MEASURING TESTING
Information Patent Grant
Spectral microscope and method for data acquisition using a spectra...
- Patent number 7,257,289
- Issue date Aug 14, 2007
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for microscopy
- Patent number 7,221,784
- Issue date May 22, 2007
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Grant
Method for user training for a scanning microscope, scanning micros...
- Patent number 7,218,762
- Issue date May 15, 2007
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Grant
Method; microscope system and software program for the observation...
- Patent number 7,120,281
- Issue date Oct 10, 2006
- Leica Microsystems CMS GmbH,
- Frank Olschewski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and arrangement for imaging and measuring microscopic three-...
- Patent number 7,015,906
- Issue date Mar 21, 2006
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for controlling analytical and adjustment op...
- Patent number 7,006,675
- Issue date Feb 28, 2006
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Grant
Method for time-optimized acquisition of special spectra using a sc...
- Patent number 6,947,861
- Issue date Sep 20, 2005
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G01 - MEASURING TESTING
Information Patent Grant
Microscope and method for analyzing acquired scan data
- Patent number 6,721,690
- Issue date Apr 13, 2004
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Microscope system and method for shading correction of lenses prese...
- Publication number 20070076232
- Publication date Apr 5, 2007
- Leica Microsystems CMS GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Application
Method for correcting drift in an optical device
- Publication number 20050141081
- Publication date Jun 30, 2005
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for the analysis of co-localizations
- Publication number 20050109949
- Publication date May 26, 2005
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G01 - MEASURING TESTING
Information Patent Application
Method for self-monitoring a microscope system, microscope system,...
- Publication number 20050046930
- Publication date Mar 3, 2005
- Frank Olschewski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for separating fluorescence spectra of dyes present in a sample
- Publication number 20050046836
- Publication date Mar 3, 2005
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Application
Method for setting a fluorescence spectrum measurement system for m...
- Publication number 20050046835
- Publication date Mar 3, 2005
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Application
Arrangement and method for controlling and operating a microscope
- Publication number 20050041861
- Publication date Feb 24, 2005
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detector and method for detecting weak fluorescent radiation with a...
- Publication number 20050024637
- Publication date Feb 3, 2005
- Leical Microsystems Heidelberg GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Application
Method for performing interactions on microscopic subjects that cha...
- Publication number 20040197017
- Publication date Oct 7, 2004
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Arrangement For Microscopy
- Publication number 20040109169
- Publication date Jun 10, 2004
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Application
Method, Arrangement, and Software for Monitoring and Controlling a...
- Publication number 20040105146
- Publication date Jun 3, 2004
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Application
Microscope system and method for the analysis and evaluation of mul...
- Publication number 20040098205
- Publication date May 20, 2004
- Lecia Microsystems Heidelberg GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Application
Microscope system and method for detecting and compensating for cha...
- Publication number 20040080818
- Publication date Apr 29, 2004
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Application
Method, arrangement, and software for optimizing the image quality...
- Publication number 20040022449
- Publication date Feb 5, 2004
- Frank Olschewski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTRAL MICROSCOPE AND METHOD FOR DATA ACQUISITION USING A SPECTRA...
- Publication number 20030231825
- Publication date Dec 18, 2003
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Application
Method for time-optimized acquisition of special spectra using a sc...
- Publication number 20030204379
- Publication date Oct 30, 2003
- Frank Olschewski
- G01 - MEASURING TESTING
Information Patent Application
Method for user training for a scanning microscope, scanning micros...
- Publication number 20030155494
- Publication date Aug 21, 2003
- Frank Olschewski
- G02 - OPTICS
Information Patent Application
Method; microscope system and software program for the observation...
- Publication number 20030044054
- Publication date Mar 6, 2003
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for adjusting the image acquisition system of a m...
- Publication number 20030011674
- Publication date Jan 16, 2003
- Leica Microsystems Heidelberg GmbH
- Frank Olschewski
- G02 - OPTICS
Information Patent Application
Method and arrangement for imaging and measuring microscopic three-...
- Publication number 20020158966
- Publication date Oct 31, 2002
- Frank Olschewski
- G01 - MEASURING TESTING
Information Patent Application
Method and arrangement for controlling analytical and adjustment op...
- Publication number 20020090118
- Publication date Jul 11, 2002
- Frank Olschewski
- G02 - OPTICS
Information Patent Application
Method, arrangement, and system for ascertaining process variables
- Publication number 20020085763
- Publication date Jul 4, 2002
- Frank Olschewski
- G01 - MEASURING TESTING
Information Patent Application
Microscope and method for analyzing acquired scan data
- Publication number 20020027193
- Publication date Mar 7, 2002
- Frank Olschewski
- G02 - OPTICS

Frank Olschewski

Person

Patents Grantslast 30 patents

Method, arrangement, and software for optimizing the image quality...

Method for self-monitoring a microscope system, microscope system,...

Method for performing interactions on microscopic subjects that cha...

Microscope system and method for the analysis and evaluation of mul...

Method for separating fluorescence spectra of dyes present in a sample

Method and system for the analysis of co-localizations

Method for setting a fluorescence spectrum measurement system for m...

Spectral microscope and method for data acquisition using a spectra...

Method and arrangement for microscopy

Method for user training for a scanning microscope, scanning micros...

Method; microscope system and software program for the observation...

Method and arrangement for imaging and measuring microscopic three-...

Method and arrangement for controlling analytical and adjustment op...

Method for time-optimized acquisition of special spectra using a sc...

Microscope and method for analyzing acquired scan data

Patents Applicationslast 30 patents

Microscope system and method for shading correction of lenses prese...

Method for correcting drift in an optical device

Method and system for the analysis of co-localizations

Method for self-monitoring a microscope system, microscope system,...

Method for separating fluorescence spectra of dyes present in a sample

Method for setting a fluorescence spectrum measurement system for m...

Arrangement and method for controlling and operating a microscope

Detector and method for detecting weak fluorescent radiation with a...

Method for performing interactions on microscopic subjects that cha...

Method and Arrangement For Microscopy

Method, Arrangement, and Software for Monitoring and Controlling a...

Microscope system and method for the analysis and evaluation of mul...

Microscope system and method for detecting and compensating for cha...

Method, arrangement, and software for optimizing the image quality...

SPECTRAL MICROSCOPE AND METHOD FOR DATA ACQUISITION USING A SPECTRA...

Method for time-optimized acquisition of special spectra using a sc...

Method for user training for a scanning microscope, scanning micros...

Method; microscope system and software program for the observation...

Method and system for adjusting the image acquisition system of a m...

Method and arrangement for imaging and measuring microscopic three-...

Method and arrangement for controlling analytical and adjustment op...

Method, arrangement, and system for ascertaining process variables

Microscope and method for analyzing acquired scan data