Frank Thys

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Willebroek, BE

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Patents Grantslast 30 patents

Information Patent Grant
Optical scanning probe
- Patent number 9,696,146
- Issue date Jul 4, 2017
- Nikon Metrology NV
- Patrick Blanckaert
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe for scanning the features of an object and methods th...
- Patent number 7,428,061
- Issue date Sep 23, 2008
- Metris IPR NV
- Bart Van Coppenolle
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe for scanning the features of an object and methods th...
- Patent number 7,009,717
- Issue date Mar 7, 2006
- Metris N.V.
- Bart Van Coppenolle
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT PROBE UNIT FOR METROLOGY APPLICATIONS
- Publication number 20180172442
- Publication date Jun 21, 2018
- NIKON METROLOGY N.V.
- Frank Thys
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SCANNING PROBE
- Publication number 20150043008
- Publication date Feb 12, 2015
- NIKON METROLOGY N.V.
- Patrick Blanckaert
- G01 - MEASURING TESTING
Information Patent Application
Optical probe for scanning the features of an object and methods th...
- Publication number 20060215176
- Publication date Sep 28, 2006
- Bart Van Coppenolle
- G01 - MEASURING TESTING
Information Patent Application
Optical probe for scanning the features of an object and methods th...
- Publication number 20040130729
- Publication date Jul 8, 2004
- Bart Van Coppenolle
- G01 - MEASURING TESTING