Frank van der Heijden

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Testing circuit and method
- Patent number 8,566,656
- Issue date Oct 22, 2013
- NXP B.V.
- Vladimir Aleksandar Zivkovic
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Testing Circuit and Method
- Publication number 20110148445
- Publication date Jun 23, 2011
- Vladimir Aleksandar Zivkovic
- G01 - MEASURING TESTING