Frank Van Der Heyden

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Testing of integrated circuits
- Patent number 7,409,612
- Issue date Aug 5, 2008
- NXP B.V.
- Leon Maria Albertus Van De Logt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Testing of integrated circuits
- Publication number 20060100810
- Publication date May 11, 2006
- Koninklijke Philips Electronics N.V.
- Leon Maria Albertus Van De Logt
- G01 - MEASURING TESTING