Frank Wirbeleit

Person

Dresden, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for forming a strained transistor by stress memorization bas...
- Patent number 9,117,929
- Issue date Aug 25, 2015
- GLOBALFOUNDRIES Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor with embedded strain-inducing material formed in diamond...
- Patent number 8,664,056
- Issue date Mar 4, 2014
- GLOBALFOUNDRIES Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of a semiconductor device with extended epitaxial semic...
- Patent number 8,642,420
- Issue date Feb 4, 2014
- GLOBALFOUNDRIES, INC.
- Stefan Flachowsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices having encapsulated isolation regions and rel...
- Patent number 8,536,019
- Issue date Sep 17, 2013
- GLOBALFOUNDRIES, INC.
- Ricardo P. Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Body controlled double channel transistor and circuits comprising t...
- Patent number 8,507,953
- Issue date Aug 13, 2013
- GLOBALFOUNDRIES Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for differential spacer removal by wet chemical etch process...
- Patent number 8,298,924
- Issue date Oct 30, 2012
- Advanced Micro Devices, Inc.
- Maciej Wiatr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Static RAM cell design and multi-contact regime for connecting doub...
- Patent number 8,264,020
- Issue date Sep 11, 2012
- Advanced Micro Devices, Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Static RAM cell design and multi-contact regime for connecting doub...
- Patent number 8,183,096
- Issue date May 22, 2012
- Advanced Micro Devices, Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional transistor with double channel configuration
- Patent number 8,164,145
- Issue date Apr 24, 2012
- GLOBALFOUNDRIES, INC.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device comprising isolation trenches inducing differe...
- Patent number 8,138,571
- Issue date Mar 20, 2012
- GLOBALFOUNDRIES Inc.
- Christoph Schwan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a semiconductor structure comprising a formation...
- Patent number 8,003,460
- Issue date Aug 23, 2011
- GLOBALFOUNDRIES Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a strained transistor by stress memorization bas...
- Patent number 7,964,458
- Issue date Jun 21, 2011
- GLOBALFOUNDRIES Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for selectively forming strain in a transistor by a stress m...
- Patent number 7,906,385
- Issue date Mar 15, 2011
- GLOBALFOUNDRIES Inc.
- Markus Lenski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Body controlled double channel transistor and circuits comprising t...
- Patent number 7,880,239
- Issue date Feb 1, 2011
- GLOBALFOUNDRIES Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of memory instability by local adaptation of re-crystalli...
- Patent number 7,811,876
- Issue date Oct 12, 2010
- GLOBALFOUNDRIES Inc.
- Casey Scott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inline stress evaluation in microstructure devices
- Patent number 7,787,108
- Issue date Aug 31, 2010
- GLOBALFOUNDRIES Inc.
- Frank Wirbeleit
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming a semiconductor structure
- Patent number 7,727,827
- Issue date Jun 1, 2010
- GLOBALFOUNDRIES Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stressed MOS device
- Patent number 7,696,534
- Issue date Apr 13, 2010
- Advanced Micro Devices, Inc.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation of transistor having a strained channel region including...
- Patent number 7,569,437
- Issue date Aug 4, 2009
- Advanced Micro Devices, Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a semiconductor device comprising isolation trench...
- Patent number 7,547,610
- Issue date Jun 16, 2009
- Advanced Micro Devices, Inc.
- Christoph Schwan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technique for transferring strain into a semiconductor region
- Patent number 7,494,906
- Issue date Feb 24, 2009
- Advanced Micro Devices, Inc.
- Thorsten Kammler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-biasing transistor structure and an SRAM cell having less than...
- Patent number 7,442,971
- Issue date Oct 28, 2008
- Advanced Micro Devices, Inc.
- Frank Wirbeleit
- G11 - INFORMATION STORAGE
Information Patent Grant
Stressed MOS device and method for its fabrication
- Patent number 7,410,859
- Issue date Aug 12, 2008
- Advanced Micro Devices, Inc.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having nanowire contact structures and method...
- Patent number 7,329,606
- Issue date Feb 12, 2008
- Advanced Micro Devices, Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TRANSISTOR WITH STRESS ENHANCED CHANNEL AND METHODS FOR FABRICATION
- Publication number 20130175610
- Publication date Jul 11, 2013
- GLOBALFOUNDRIES INC.
- Stefan Flachowsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATION OF A SEMICONDUCTOR DEVICE WITH EXTENDED EPITAXIAL SEMIC...
- Publication number 20130052779
- Publication date Feb 28, 2013
- GLOBALFOUNDRIES INC.
- Stefan Flachowsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES HAVING ENCAPSULATED ISOLATION REGIONS AND REL...
- Publication number 20120292734
- Publication date Nov 22, 2012
- GLOBALFOUNDRIES INC.
- Ricardo P. MIKALO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STATIC RAM CELL DESIGN AND MULTI-CONTACT REGIME FOR CONNECTING DOUB...
- Publication number 20120193724
- Publication date Aug 2, 2012
- Advanced Micro Devices, Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transistor With Embedded Strain-Inducing Material Formed in Diamond...
- Publication number 20110294269
- Publication date Dec 1, 2011
- GLOBALFOUNDRIES INC.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Forming a Strained Transistor by Stress Memorization Bas...
- Publication number 20110223733
- Publication date Sep 15, 2011
- GLOBALFOUNDRIES INC.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Body Controlled Double Channel Transistor and Circuits Comprising t...
- Publication number 20110080772
- Publication date Apr 7, 2011
- GLOBALFOUNDRIES INC.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING A SEMICONDUCTOR STRUCTURE
- Publication number 20100203698
- Publication date Aug 12, 2010
- GLOBALFOUNDRIES INC.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STATIC RAM CELL DESIGN AND MULTI-CONTACT REGIME FOR CONNECTING DOUB...
- Publication number 20100052069
- Publication date Mar 4, 2010
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL TRANSISTOR WITH DOUBLE CHANNEL CONFIGURATION
- Publication number 20090321835
- Publication date Dec 31, 2009
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE COMPRISING ISOLATION TRENCHES INDUCING DIFFERE...
- Publication number 20090236667
- Publication date Sep 24, 2009
- Advanced Micro Devices, Inc.
- Christoph Schwan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCTION OF MEMORY INSTABILITY BY LOCAL ADAPTATION OF RE-CRYSTALLI...
- Publication number 20090221115
- Publication date Sep 3, 2009
- Casey Scott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SELECTIVELY FORMING STRAIN IN A TRANSISTOR BY A STRESS M...
- Publication number 20090197381
- Publication date Aug 6, 2009
- Markus Lenski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BODY CONTROLLED DOUBLE CHANNEL TRANSISTOR AND CIRCUITS COMPRISING T...
- Publication number 20090194824
- Publication date Aug 6, 2009
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-BIASING TRANSISTOR STRUCTURE AND AN SRAM CELL HAVING LESS THAN...
- Publication number 20090026521
- Publication date Jan 29, 2009
- Frank Wirbeleit
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF FORMING A SEMICONDUCTOR STRUCTURE COMPRISING A FORMATION...
- Publication number 20090004799
- Publication date Jan 1, 2009
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING A SEMICONDUCTOR STRUCTURE COMPRISING AN IMPLANTAT...
- Publication number 20080299733
- Publication date Dec 4, 2008
- Patrick Press
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRESSED MOS DEVICE
- Publication number 20080258175
- Publication date Oct 23, 2008
- Advanced Micro Devices, Inc.
- Igor PEIDOUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING A SEMICONDUCTOR STRUCTURE
- Publication number 20080242040
- Publication date Oct 2, 2008
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DIFFERENTIAL SPACER REMOVAL BY WET CHEMICAL ETCH PROCESS...
- Publication number 20080203486
- Publication date Aug 28, 2008
- Maciej Wiatr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INLINE STRESS EVALUATION IN MICROSTRUCTURE DEVICES
- Publication number 20080158541
- Publication date Jul 3, 2008
- Frank Wirbeleit
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE COMPRISING ISOLATION TRENCHES INDUCING DIFFERE...
- Publication number 20080079085
- Publication date Apr 3, 2008
- Christoph Schwan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING A STRAINED TRANSISTOR BY STRESS MEMORIZATION BAS...
- Publication number 20080026572
- Publication date Jan 31, 2008
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR HAVING A STRAINED CHANNEL REGION INCLUDING A PERFORMANCE...
- Publication number 20080023692
- Publication date Jan 31, 2008
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SRAM cells including self-stabilizing transistor structures
- Publication number 20070176246
- Publication date Aug 2, 2007
- Advanced Micro Devices, Inc.
- Frank Wirbeleit
- G11 - INFORMATION STORAGE
Information Patent Application
Methods for fabrication of a stressed MOS device
- Publication number 20070072380
- Publication date Mar 29, 2007
- Advanced Micro Devices, Inc.
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUE FOR REDUCING SILICIDE NON-UNIFORMITIES BY ADAPTING A VERT...
- Publication number 20060270202
- Publication date Nov 30, 2006
- Frank Wirbeleit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Technique for evaluating local electrical characteristics in semico...
- Publication number 20060022197
- Publication date Feb 2, 2006
- Frank Wirbeleit
- G01 - MEASURING TESTING
Information Patent Application
Self-biasing transistor structure and an SRAM cell having less than...
- Publication number 20060022282
- Publication date Feb 2, 2006
- Frank Wirbeleit
- G11 - INFORMATION STORAGE
Information Patent Application
Technique for transferring strain into a semiconductor region
- Publication number 20060003510
- Publication date Jan 5, 2006
- Thorsten Kammler
- H01 - BASIC ELECTRIC ELEMENTS

Frank Wirbeleit

Person

Patents Grantslast 30 patents

Method for forming a strained transistor by stress memorization bas...

Transistor with embedded strain-inducing material formed in diamond...

Fabrication of a semiconductor device with extended epitaxial semic...

Semiconductor devices having encapsulated isolation regions and rel...

Body controlled double channel transistor and circuits comprising t...

Method for differential spacer removal by wet chemical etch process...

Static RAM cell design and multi-contact regime for connecting doub...

Static RAM cell design and multi-contact regime for connecting doub...

Three-dimensional transistor with double channel configuration

Semiconductor device comprising isolation trenches inducing differe...

Method of forming a semiconductor structure comprising a formation...

Method for forming a strained transistor by stress memorization bas...

Method for selectively forming strain in a transistor by a stress m...

Body controlled double channel transistor and circuits comprising t...

Reduction of memory instability by local adaptation of re-crystalli...

Inline stress evaluation in microstructure devices

Method of forming a semiconductor structure

Stressed MOS device

Formation of transistor having a strained channel region including...

Method of making a semiconductor device comprising isolation trench...

Technique for transferring strain into a semiconductor region

Self-biasing transistor structure and an SRAM cell having less than...

Stressed MOS device and method for its fabrication

Semiconductor device having nanowire contact structures and method...

Patents Applicationslast 30 patents

TRANSISTOR WITH STRESS ENHANCED CHANNEL AND METHODS FOR FABRICATION

FABRICATION OF A SEMICONDUCTOR DEVICE WITH EXTENDED EPITAXIAL SEMIC...

SEMICONDUCTOR DEVICES HAVING ENCAPSULATED ISOLATION REGIONS AND REL...

STATIC RAM CELL DESIGN AND MULTI-CONTACT REGIME FOR CONNECTING DOUB...

Transistor With Embedded Strain-Inducing Material Formed in Diamond...

Method for Forming a Strained Transistor by Stress Memorization Bas...

Body Controlled Double Channel Transistor and Circuits Comprising t...

METHOD OF FORMING A SEMICONDUCTOR STRUCTURE

STATIC RAM CELL DESIGN AND MULTI-CONTACT REGIME FOR CONNECTING DOUB...

THREE-DIMENSIONAL TRANSISTOR WITH DOUBLE CHANNEL CONFIGURATION

SEMICONDUCTOR DEVICE COMPRISING ISOLATION TRENCHES INDUCING DIFFERE...

REDUCTION OF MEMORY INSTABILITY BY LOCAL ADAPTATION OF RE-CRYSTALLI...

METHOD FOR SELECTIVELY FORMING STRAIN IN A TRANSISTOR BY A STRESS M...

BODY CONTROLLED DOUBLE CHANNEL TRANSISTOR AND CIRCUITS COMPRISING T...

SELF-BIASING TRANSISTOR STRUCTURE AND AN SRAM CELL HAVING LESS THAN...

METHOD OF FORMING A SEMICONDUCTOR STRUCTURE COMPRISING A FORMATION...

METHOD OF FORMING A SEMICONDUCTOR STRUCTURE COMPRISING AN IMPLANTAT...

STRESSED MOS DEVICE

METHOD OF FORMING A SEMICONDUCTOR STRUCTURE

METHOD FOR DIFFERENTIAL SPACER REMOVAL BY WET CHEMICAL ETCH PROCESS...

INLINE STRESS EVALUATION IN MICROSTRUCTURE DEVICES

SEMICONDUCTOR DEVICE COMPRISING ISOLATION TRENCHES INDUCING DIFFERE...

METHOD FOR FORMING A STRAINED TRANSISTOR BY STRESS MEMORIZATION BAS...

TRANSISTOR HAVING A STRAINED CHANNEL REGION INCLUDING A PERFORMANCE...

SRAM cells including self-stabilizing transistor structures

Methods for fabrication of a stressed MOS device

TECHNIQUE FOR REDUCING SILICIDE NON-UNIFORMITIES BY ADAPTING A VERT...

Technique for evaluating local electrical characteristics in semico...

Self-biasing transistor structure and an SRAM cell having less than...

Technique for transferring strain into a semiconductor region