Franklin P. Myers

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Mesa, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Magnetometer test arrangement and method
- Patent number 9,612,309
- Issue date Apr 4, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Peter T. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Magnetometer test arrangement and method
- Patent number 8,963,538
- Issue date Feb 24, 2015
- Freescale Semiconductor Inc.
- Peter T. Jones
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MAGNETOMETER TEST ARRANGEMENT AND METHOD
- Publication number 20150130443
- Publication date May 14, 2015
- Peter T. Jones
- G01 - MEASURING TESTING
Information Patent Application
MAGNETOMETER TEST ARRANGEMENT AND METHOD
- Publication number 20120210562
- Publication date Aug 23, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Peter T. Jones
- G01 - MEASURING TESTING