Franklin Roy Dietz

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Mohnton, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of thin film process control and calibration standard for op...
- Patent number 6,490,033
- Issue date Dec 3, 2002
- Lucent Technologies Inc.
- David Gerald Coult
- G01 - MEASURING TESTING
Information Patent Grant
In-situ automated contactless thickness measurement for wafer thinning
- Patent number 6,437,868
- Issue date Aug 20, 2002
- Agere Systems Guardian Corp.
- David Gerald Coult
- B24 - GRINDING POLISHING
Information Patent Grant
Detecting trace levels of copper
- Patent number 6,146,909
- Issue date Nov 14, 2000
- Lucent Technologies Inc.
- Joze E. Antol
- G01 - MEASURING TESTING