Franklin W. Mayo

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Houston, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for generation of test bitstreams and testing...
- Patent number 6,101,864
- Issue date Aug 15, 2000
- I/O Sensors, Inc.
- Michael L. Abrams
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for calibration of stray capacitance mismatch...
- Patent number 6,035,694
- Issue date Mar 14, 2000
- I/O of Austin, Inc.
- Scott T. Dupuie
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for generation of test bitstreams and testing...
- Patent number 6,023,960
- Issue date Feb 15, 2000
- I/O Sensors, Inc.
- Michael L. Abrams
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus with mechanical and electric springs and method for its m...
- Patent number 5,852,242
- Issue date Dec 22, 1998
- I/O Sensors, Inc.
- Burton A. Devolk
- G01 - MEASURING TESTING