Franklyn Shihyu Wu

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San Francisco, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer level global bitmap characterization in integrated circuit te...
- Patent number 7,137,085
- Issue date Nov 14, 2006
- Advanced Micro Devices, Inc.
- John J. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing distribution signatures in integrated circuit techno...
- Patent number 7,099,789
- Issue date Aug 29, 2006
- Advanced Micro Devices, Inc.
- Franklyn Shihyu Wu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for processing tester information and visualizati...
- Patent number 6,907,379
- Issue date Jun 14, 2005
- Advanced Micro Devices, Inc.
- Franklyn Shihyu Wu
- G01 - MEASURING TESTING